Thin-film transistor device and method for manufacturing same, organic electroluminescent display element, and organic electroluminescent display device

ABSTRACT

A thin film transistor element is formed in each of adjacent first and second apertures defined by partition walls. In plan view of a bottom portion of the first aperture, a center of a total of areas of a source electrode portion and a drain electrode portion is offset from a center of area of the bottom portion in a direction opposite a direction of the second aperture, and in plan view of a bottom portion of the second aperture, a center of a total of areas of a source electrode portion and a drain electrode portion is offset from a center of area of the bottom portion in a direction opposite a direction of the first aperture.

CROSS REFERENCE TO RELATED APPLICATION

This is a continuation application of PCT Application No.PCT/JP2012/006000 filed Sep. 21, 2012, designating the United States ofAmerica, the disclosure of which, including the specification, drawingsand claims, is incorporated herein by reference in its entirety.

TECHNICAL FIELD

The present disclosure relates to a thin film transistor device and amanufacturing method thereof, an organic EL display element, and anorganic EL display device.

DESCRIPTION OF THE RELATED ART

In liquid crystal display panels and organic EL display panels, controlof light emission is performed in units of subpixels. To make thispossible, thin film transistor devices are used in liquid crystaldisplay panels and organic EL display panels. A thin film transistordevice includes a thin film transistor (TFT) element formed for eachsubpixel. In particular, development is in progress of a thin filmtransistor device that includes a semiconductor layer formed by usingorganic semiconductor material.

As illustrated in FIG. 12A, a conventional organic TFT device includes,for instance: a substrate 9011; gate electrodes 9012 a, 9012 b; aninsulating layer 9013; source electrodes 9014 a, 9014 b; drainelectrodes (undepicted); and organic semiconductor layers 9017 a, 9017b. The gate electrodes 9012 a, 9012 b, the insulating layer 9013, thesource electrodes 9014 a, 9014 b, the drain electrodes, and the organicsemiconductor layers 9017 a, 9017 b are formed by being layered one ontop of another in the stated order on the substrate 9011. The organicsemiconductor layers 9017 a, 9017 b are formed by applying organicsemiconductor ink onto the insulating layer 9013 and by drying theapplied organic semiconductor ink. The organic semiconductor layer 9017a is formed so as to fill the gap between the source electrode 9014 aand the corresponding drain electrode and cover the source electrode9014 a and the corresponding drain electrode. Similarly, the organicsemiconductor layer 9017 b is formed so as to fill the gap between thesource electrode 9014 b and the corresponding drain electrode and coverthe source electrode 9014 b and the corresponding drain electrode.

In addition, as illustrated in FIG. 12A, partition walls 9016 are formedon the insulating layer 9013. The partition walls 9016 partitionadjacent TFT elements from one another. The partition walls 9016 definea plurality of apertures, namely apertures 9016 a through 9016 c. Theaperture 9016 a has a bottom portion where a connection wire 9015 thatis connected with a drain electrode remains exposed. Further, an organicsemiconductor layer is not formed with respect to the aperture 9016 a.The connection wire 9015 is an electrode to be connected to an electrodeof a light-emitting element portion to be formed above the TFT element.On the other hand, the organic semiconductor layers 9017 a, 9017 b areformed with respect to the apertures 9016 b, 9016 c, respectively. Notethat the organic semiconductor layers 9017 a, 9017 b are partitionedfrom one another.

As already discussed above, a TFT device such as the organic TFT deviceillustrated in FIG. 12A is used in a liquid crystal display panel, anorganic EL display panel, or the like. Further, each TFT element in sucha TFT device controls light emission of a light-emitting element portionaccording to signals input to the gate electrodes 9012 a, 9012 b, forinstance, in the case illustrated in FIG. 12A.

CITATION LIST Patent Literature

[Patent Literature 1]

-   Japanese Patent Application Publication No. 2009-76791

SUMMARY

However, in the organic TFT device pertaining to conventional technologyas described above, there is a risk of a situation taking place where,upon application of organic semiconductor ink for forming the organicsemiconductor layers 9017 a, 9017 b, organic semiconductor ink appliedwith respect to the aperture 9016 b meet and blend with organicsemiconductor ink applied with respect to the adjacent aperture 9016 c.In specific, as illustrated in FIG. 12B, when respectively droppingorganic semiconductor ink 90170, 90171 with respect to the apertures9016 b, 9016 c defined by the partition walls 9016, there are caseswhere the organic semiconductor ink 90170 and the organic semiconductorink 90171 run into and blend with each other (as indicated by the arrowin FIG. 12B). This results in the organic semiconductor layers 9017 a,9017 b being provided with undesirable layer-thicknesses. Further, whenit is desired to form each of the organic semiconductor layers 9017 a,9017 b as an organic semiconductor layer containing different componentsfrom the other, the above-described meeting and blending of organicsemiconductor ink results in degradation of transistor performance.

It can be assumed that the above-described problem is likely to occurespecially in a liquid crystal display panel, an organic EL displaypanel, etc. This is since, as already described above, there is a demandfor realizing a liquid crystal display panel, an organic EL displaypanel, etc., with higher definition, which gives rise to a demand fordownsizing subpixels therein. When the downsizing of subpixels isperformed in response to such a demand, the distance between theaperture 9016 b and the aperture 9016 c is shortened, and the riskincreases of the organic semiconductor ink 90170 and the organicsemiconductor ink 90171 meeting and blending with each other. As such,the above-described problem is likely to take place.

Note that the same problems as described above can be expected to occurwhen an inorganic semiconductor layer is to be formed according to theapplication method.

Non-limiting and exemplary embodiments provide a thin film transistordevice having high quality and a manufacturing method thereof, anorganic EL display element, and an organic EL display device. Such ahigh-quality thin film transistor device is realized by preventingsemiconductor ink applied with respect to one aperture from meeting andblending with semiconductor ink applied with respect to an adjacentaperture when dropping the semiconductor ink with respect to theapertures.

In one general aspect, the techniques disclosed here feature a thin filmtransistor device having the following structure.

The thin film transistor device comprises: a first thin film transistorelement and a second thin film transistor element that are arranged soas to be adjacent to each other with a gap therebetween. Each of thefirst thin film transistor element and the second thin film transistorelement comprises: a gate electrode; a source electrode and a drainelectrode; an insulating layer; and a semiconductor layer.

The source electrode and the drain electrode are disposed on theinsulating layer with a gap therebetween.

The insulating layer is disposed on the gate electrode.

The semiconductor layer is disposed on the source electrode and thedrain electrode so as to cover the source electrode and the drainelectrode and fill the gap between the source electrode and the drainelectrode, and is in contact with the source electrode and the drainelectrode.

The thin film transistor device further comprises partition wallsdisposed on the insulating layer and partitioning the semiconductorlayer of the first thin film transistor element from the semiconductorlayer of the second thin film transistor element, the partition wallshaving liquid-repellant surfaces and defining a first aperture and asecond aperture.

The first aperture surrounds at least a part of each of the sourceelectrode and the drain electrode of the first thin film transistorelement, the second aperture is adjacent to the first aperture andsurrounds at least a part of each of the source electrode and the drainelectrode of the second thin film transistor element, and a bottomportion of each of the first and second apertures includes a sourceelectrode portion being a bottom portion of the source electrode and adrain electrode portion being a bottom portion of the drain electrode.

In the thin film transistor device, in plan view of the bottom portionof the first aperture, a center of a total of areas of the sourceelectrode portion and the drain electrode portion is offset from acenter of area of the bottom portion in a direction opposite a directionof the second aperture, and in plan view of the bottom portion of thesecond aperture, a center of a total of areas of the source electrodeportion and the drain electrode portion is offset from a center of areaof the bottom portion in a direction opposite a direction of the firstaperture.

In the thin film transistor device, at the bottom portion of the firstaperture, the center of the total of areas of the source electrode andthe drain electrode is offset from the center of area of the bottomportion in the direction opposite the direction of the second aperture.Similarly, at the bottom portion of the second aperture, the center ofthe total of areas of the source electrode and the drain electrode isoffset from the center of area of the bottom portion in the directionopposite the direction of the first aperture. Due to this, whenapplication (dropping) of semiconductor ink for forming semiconductorlayers is performed in the manufacture of the thin film transistordevice, a portion of the surface of semiconductor ink applied withrespect to the first aperture having the greatest height is offset fromthe center of area of the first aperture in the direction opposite thedirection of the second aperture, and a portion of the surface of thesemiconductor ink applied with respect to the second aperture having thegreatest height is offset from the center of area of the second aperturein the direction opposite the direction of the first aperture, and thusare distant from each other.

This is due to the source electrode and the drain electrode havinghigher wettability compared to the surface of the insulating layer. Atthe bottom portion of the first aperture, due to the source electrodeand the drain electrode having such characteristics being disposed so asto be offset as described above, the surface of the semiconductor inkapplied with respect to the first aperture exhibits a shape of beingbiased in a direction departing from the second aperture. Similarly, atthe bottom portion of the second aperture, due to the source electrodeand the drain electrode being disposed so as to be offset as describedabove, the surface of the semiconductor ink applied with respect to thesecond aperture exhibits a shape of being biased in a directiondeparting from the first aperture. As such, in the manufacture of thethin film transistor device, the undesirable meeting and blending ofsemiconductor ink applied (dropped) with respect to the first apertureand semiconductor ink applied (dropped) with respect to the secondaperture is prevented.

Since the meeting and blending of semiconductor ink applied (dropped)with respect to adjacent apertures is prevented, the thin filmtransistor device has high quality.

These general and specific aspects may be implemented by using anorganic EL display element, an organic EL display device, and a methodof manufacturing a thin film transistor device.

Additional benefits and advantages of the disclosed embodiments will beapparent from the specification and figures. The benefits and/oradvantages may be individually provided by the various embodiments andfeatures of the specification and drawings disclosed, and need not allbe provided in order to obtain one or more of the same.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic block diagram illustrating an overall structure ofan organic EL display device 1 pertaining to embodiment 1 of the presentinvention.

FIG. 2 is a schematic cross-sectional view illustrating a partialstructure of an organic EL display panel 10.

FIG. 3A is a schematic plan view illustrating a partial structure of aTFT substrate 101, and FIG. 3B is a schematic cross-sectional viewillustrating a partial structure of the TFT substrate 101.

FIG. 4A is a process flow diagram providing an overview of a method ofmanufacturing the organic EL display panel 10, and FIG. 4B is a processflow diagram providing an overview of a method of forming the TFTsubstrate 101.

FIGS. 5A through 5C are schematic process diagrams illustrating someprocedures among procedures involved in the manufacturing of the TFTsubstrate 101.

FIGS. 6A through 6C are schematic process diagrams illustrating someprocedures among procedures involved in the manufacturing of the TFTsubstrate 101.

FIG. 7 is a schematic process diagram illustrating a procedure amongprocedures involved in the manufacturing of the TFT substrate 101.

FIGS. 8A and 8B are schematic process diagrams illustrating someprocedures among procedures involved in the manufacturing of the TFTsubstrate 101.

FIG. 9A is a schematic plan view illustrating, in a structure of anorganic EL display panel pertaining to embodiment 2, a partial structureof a TFT substrate, FIG. 9B is a schematic plan view illustrating, in astructure of an organic EL display panel pertaining to embodiment 3, apartial structure of a TFT substrate, and FIG. 9C is a schematic planview illustrating, in a structure of an organic EL display panelpertaining to embodiment 4, a partial structure of a TFT substrate.

FIG. 10A is a schematic plan view illustrating, in a structure of anorganic EL display panel pertaining to embodiment 5, a partial structureof a TFT substrate, FIG. 10B is a schematic plan view illustrating, in astructure of an organic EL display panel pertaining to embodiment 6, apartial structure of a TFT substrate, and FIG. 10C is a schematic planview illustrating, in a structure of an organic EL display panelpertaining to embodiment 7, a partial structure of a TFT substrate.

FIG. 11A is a schematic plan view illustrating a shape of an opening ofan aperture defined by partition walls in a TFT substrate pertaining tomodification 1, FIG. 11B is a schematic plan view illustrating a shapeof an opening of an aperture defined by partitions wall in a TFTsubstrate pertaining to modification 2, and FIG. 11C is a schematic planview illustrating a shape of an opening of an aperture defined bypartition walls in a TFT substrate pertaining to modification 3.

FIG. 12A is a cross-sectional view illustrating, in a structure of anorganic EL display device pertaining to conventional technology, apartial structure of a TFT substrate, and FIG. 12B is a cross-sectionalview illustrating a procedure pertaining to application of organicsemiconductor ink among procedures involved in the manufacturing of theTFT substrate pertaining to conventional technology.

DETAILED DESCRIPTION Overview of Aspects of Present Invention

A thin film transistor device pertaining to one aspect of the presentinvention comprises: a first thin film transistor element and a secondthin film transistor element that are arranged so as to be adjacent toeach other with a gap therebetween. Each of the first thin filmtransistor element and the second thin film transistor elementcomprises: a gate electrode; a source electrode and a drain electrode;an insulating layer; and a semiconductor layer.

The source electrode and the drain electrode are disposed on theinsulating layer with a gap therebetween.

The insulating layer is disposed on the gate electrode.

The semiconductor layer is disposed on the source electrode and thedrain electrode so as to cover the source electrode and the drainelectrode and fill the gap between the source electrode and the drainelectrode, and is in contact with the source electrode and the drainelectrode.

The thin film transistor device pertaining to one aspect of the presentinvention further comprises partition walls disposed on the insulatinglayer and partitioning the semiconductor layer of the first thin filmtransistor element from the semiconductor layer of the second thin filmtransistor element, the partition walls having liquid-repellant surfacesand defining a first aperture and a second aperture.

The first aperture surrounds at least a part of each of the sourceelectrode and the drain electrode of the first thin film transistorelement, the second aperture is adjacent to the first aperture andsurrounds at least a part of each of the source electrode and the drainelectrode of the second thin film transistor element, and a bottomportion of each of the first and second apertures includes a sourceelectrode portion being a bottom portion of the source electrode and adrain electrode portion being a bottom portion of the drain electrode.

In the thin film transistor device pertaining to one aspect of thepresent invention, in plan view of the bottom portion of thefirst-aperture, a center of a total of areas of the source electrodeportion and the drain electrode portion is offset from a center of areaof the bottom portion in a direction opposite a direction of the secondaperture, and in plan view of the bottom portion of the second aperture,a center of a total of areas of the source electrode portion and thedrain electrode portion is offset from a center of area of the bottomportion in a direction opposite a direction of the first aperture.

Note that, when denoting: the area of the source electrode portion asA_(S); a distance from a given point to the center of area of the sourceelectrode portion as x; the area of the drain electrode portion asA_(D); a distance from the given point to the center of area of thedrain electrode portion as y, “a center of a total of areas of thesource electrode portion and the drain electrode portion”, denoted as z,can be expressed as shown in Math. 1.z=(A _(S) ×x+A _(D) ×y)/(A _(S) +A _(D))  [Math. 1]

Math. 1 is a mathematical expression defining a relationship in adirection in which a line connecting the center of area of the bottomportion of the first aperture and the center of area of the bottomportion of the third aperture extends.

In the thin film transistor device pertaining to one aspect of thepresent invention, at the bottom portion of the first aperture, thecenter of the total of areas of the source electrode and the drainelectrode is offset from the center of area of the bottom portion in thedirection opposite the direction of the second aperture. Similarly, atthe bottom portion of the second aperture, the center of the total ofareas of the source electrode and the drain electrode is offset from thecenter of area of the bottom portion in the direction opposite thedirection of the first aperture. Due to this, when dropping ofsemiconductor ink for forming semiconductor layers is performed in themanufacture of the thin film transistor device, a portion of the surfaceof semiconductor ink applied with respect to the first aperture havingthe greatest height is offset from the center of area of the firstaperture in the direction opposite the direction of the second aperture,and a portion of the surface of the semiconductor ink applied withrespect to the second aperture having the greatest height is offset fromthe center of area of the second aperture in the direction opposite thedirection of the first aperture, and thus are distant from each other.

This is due to the source electrode and the drain electrode havinghigher wettability compared to the surface of the insulating layer. Atthe bottom portion of the first aperture, due to the source electrodeand the drain electrode having such characteristics being disposed so asto be offset as described above, the surface of the semiconductor inkdropped with respect to the first aperture exhibits a shape of beingbiased in a direction departing from the second aperture. Similarly, atthe bottom portion of the second aperture, due to the source electrodeand the drain electrode being disposed so as to be offset as describedabove, the surface of the semiconductor ink dropped with respect to thesecond aperture exhibits a shape of being biased in a directiondeparting from the first aperture. As such, in the manufacture of thethin film transistor device, the undesirable meeting and blending ofsemiconductor ink dropped with respect to the first aperture andsemiconductor ink dropped with respect to the second aperture isprevented.

Since the meeting and blending of semiconductor ink dropped with respectto adjacent apertures is prevented, the thin film transistor device hashigh quality.

In the thin film transistor device pertaining to one aspect of thepresent invention, at the bottom portion of the first aperture, aportion may exist where the source electrode portion and the drainelectrode portion do not exist and thus, where the insulating layer ofthe first thin film transistor element is in direct contact with thesemiconductor layer of the first thin film transistor element, theportion being within an area of the bottom portion located in thedirection of the second aperture, and at the bottom portion of thesecond aperture, a portion may exist where the source electrode portionand the drain electrode portion do not exist and thus, where theinsulating layer of the second thin film transistor element is in directcontact with the semiconductor layer of the second thin film transistorelement, the portion being within an area of the bottom portion locatedin the direction of the first aperture. According to this structure,when semiconductor ink is dropped with respect to the first and secondapertures, a portion having greatest height of the surface of thesemiconductor ink applied with respect to the first aperture is biasedin the direction opposite the second aperture with higher certainty, anda portion having greatest height of the surface of the semiconductor inkapplied with respect to the second aperture is biased in the directionopposite the first aperture with higher certainty. As such, thesemiconductor ink dropped with respect to the first aperture and thesemiconductor ink dropped with respect to the second aperture areprevented from meeting and blending with each other with highercertainty.

In the thin film transistor device pertaining to one aspect of thepresent invention, at the bottom portion of the first aperture, theportion where the source electrode portion and the drain electrodeportion do not exist and thus, where the insulating layer of the firstthin film transistor element is in direct contact with the semiconductorlayer of the first thin film transistor element, may also exist withinan area of the bottom portion located in the direction opposite thedirection of the second aperture, and in plan view, the portion mayoccupy a greater area at the area of the bottom portion located in thedirection of the second aperture than at the area of the bottom portionlocated in the direction opposite the direction of the second aperture,and at the bottom portion of the second aperture, the portion where thesource electrode portion and the drain electrode portion do not existand thus, where the insulating layer of the second thin film transistorelement is in direct contact with the semiconductor layer of the secondthin film transistor element, may also exist within an area of thebottom portion located in the direction opposite the direction of thefirst aperture, and in plan view, the portion may occupy a greater areaat the area of the bottom portion located in the direction of the firstaperture than at the area of the bottom portion located in the directionopposite the direction of the first aperture.

When defining, at the bottom portion of each of the first and secondapertures, an area of the portion where the insulating layer is indirect contact with the semiconductor layer, the above-described statewhere the portion having greatest height of the surface of thesemiconductor ink applied with respect to the first aperture is biasedin the direction opposite the second aperture, and the portion havinggreatest height of the surface of the semiconductor ink applied withrespect to the second aperture is biased in the direction opposite thefirst aperture is realized with higher certainty. As such, thesemiconductor ink dropped with respect to the first aperture and thesemiconductor ink dropped with respect to the second aperture areprevented from meeting and blending with each other with highercertainty.

In the thin film transistor device pertaining to one aspect of thepresent invention, in plan view of the bottom portion of the firstaperture, a center of area of one of the source electrode portion andthe drain electrode portion may be offset from the center of area of thebottom portion in the direction opposite the direction of the secondaperture, and a center of area of the other one of the source electrodeportion and the drain electrode portion may coincide with the center ofarea of the bottom portion, and in plan view of the bottom portion ofthe second aperture, a center of area of one of the source electrodeportion and the drain electrode portion may be offset from the center ofarea of the bottom portion in the direction opposite the direction ofthe first aperture, and a center of area of the other one of the sourceelectrode portion and the drain electrode portion may coincide with thecenter of area of the bottom portion.

When disposing, at the bottom portion of each of the first and secondapertures, the source electrode portion and the drain electrode portionso as to be in such an arrangement as described above, the semiconductorink dropped with respect to each of the apertures can be controlled suchthat the surface of the semiconductor ink exhibits the above-describedstate. As such, the semiconductor ink dropped with respect to the firstaperture and the semiconductor ink dropped with respect to the secondaperture are prevented from meeting and blending with each other.

In the thin film transistor device pertaining to one aspect of thepresent invention, in plan view of the bottom portion of the firstaperture, a center of area of each of the source electrode portion andthe drain electrode portion may be offset from the center of area of thebottom portion in the direction opposite the direction of the secondaperture, and in plan view of the bottom portion of the second aperture,a center of area of each of the source electrode portion and the drainelectrode portion may be offset from the center of area of the bottomportion in the direction opposite the direction of the first aperture.

When disposing, at the bottom portion of each of the first and secondapertures, the source electrode portion and the drain electrode portionso as to be in such an arrangement as described above, the semiconductorink dropped with respect to each of the apertures can be controlled suchthat the surface of the semiconductor ink exhibits the above-describedstate. As such, the semiconductor ink dropped with respect to the firstaperture and the semiconductor ink dropped with respect to the secondaperture are prevented from meeting and blending with each other.

In the thin film transistor device pertaining to one aspect of thepresent invention, at the bottom portion of the first aperture, at leastone of the source electrode portion and the drain electrode portion maybe located apart from a side surface portion, of the partition walls,facing the first aperture at a side thereof located in the direction ofthe second aperture, and may be in contact with the side surface portionfacing the first aperture at a side thereof located in the directionopposite the direction of the second aperture, and at the bottom portionof the second aperture, at least one of the source electrode portion andthe drain electrode portion may be located apart from a side surfaceportion, of the partition walls, facing the second aperture at a sidethereof located in the direction of the first aperture, and may be incontact with the side surface portion facing the second aperture at aside thereof located in the direction opposite the direction of thefirst aperture. According to this structure, the semiconductor inkdropped with respect to each of the apertures can be controlled suchthat the surface of the semiconductor ink exhibits the above-describedstate. As such, the semiconductor ink dropped with respect to the firstaperture and the semiconductor ink dropped with respect to the secondaperture are prevented from meeting and blending with each other.

In the thin film transistor device pertaining to one aspect of thepresent invention, a liquid repellency of the surfaces of the partitionwalls may be greater than a liquid repellency of a surface of theinsulating layer, in each of the first and second thin film transistorelements, that is in contact with the semiconductor layer, and theliquid repellency of the surface of the insulating layer, in each of thefirst and second thin film transistor elements, that is in contact withthe semiconductor layer may be greater than a liquid repellency of asurface of each of the source electrode and the drain electrode in eachof the first and second thin film transistor elements. According to thisstructure, the semiconductor ink dropped with respect to each of theapertures can be controlled such that the surface of the semiconductorink exhibits the above-described state with even higher certainty. Assuch, the semiconductor ink dropped with respect to the first apertureand the semiconductor ink dropped with respect to the second apertureare prevented from meeting and blending with each other with even highercertainty.

In the thin film transistor device pertaining to one aspect of thepresent invention, the partition walls may further define a thirdaperture at an area that is adjacent to at least one of the firstaperture and the second aperture, an area surrounded by the thirdaperture, not having a semiconductor layer formed therein, may notfunction as a channel portion, and a bottom portion of the thirdaperture may include a wire formed for electrically connecting with oneof the source electrode and the drain electrode of the first thin filmtransistor element or one of the source electrode and the drainelectrode of the second thin film transistor element. In such astructure, the third aperture functions as a contact area. Further, evenwhen such a structure is employed, the semiconductor ink dropped withrespect to the first aperture and the semiconductor ink dropped withrespect to the second aperture are prevented from meeting and blendingwith each other, and thus, the thin film transistor device has highquality.

One aspect of the present invention is an organic EL display elementcomprising: the thin film transistor device pertaining to one aspect ofthe present invention in which the partition walls define the thirdaperture; a planarizing film formed above the thin film transistorelement and having a contact hole formed therein; a lower electrodeformed so as to cover the planarizing film and a side surface of theplanarizing film defining the contact hole, and electrically connectedwith one of the source electrode and the drain electrode in the firstthin film transistor element or one of the source electrode and thedrain electrode in the second thin film transistor element; an upperelectrode formed above the lower electrode; and an organiclight-emitting layer interposed between the lower electrode and theupper electrode, wherein the contact hole is in communication with thethird aperture of the thin film transistor element.

According to such a structure, the organic EL display element pertainingto one aspect of the present invention realizes, as is, theabove-described effect that is realized by any of the thin filmtransistor devices described above. As such, the organic EL displayelement pertaining to one aspect of the present invention has highquality.

One aspect of the present invention is an organic EL display devicecomprising the organic EL display element pertaining to one aspect ofthe present invention. According to this, the organic EL display devicepertaining to one aspect of the present invention is also ensured tohave high display quality, and at the same time, to have high yield inthe manufacture thereof.

One aspect of the present invention is a method of manufacturing a thinfilm transistor device comprising:

-   -   forming a first gate electrode and a second gate electrode on a        substrate so as to be adjacent to each other with a gap        therebetween;    -   forming an insulating layer so as to cover the first gate        electrode and the second gate electrode;    -   forming first and second source electrodes and first and second        drain electrodes on the insulating layer, wherein (i) the first        source electrode and the first drain electrode are formed with        respect to the first gate electrode with a gap therebetween,        and (ii) the second source electrode and the second drain        electrode are formed with respect to the second gate electrode        with a gap therebetween;    -   depositing a layer of photosensitive resist material such that,        above the insulating layer, the layer of photosensitive resist        material covers the first and second source electrodes and the        first and second drain electrodes;    -   forming partition walls on the insulating layer by performing        mask exposure and patterning of the layer of photosensitive        resist material, the partition walls having liquid-repellant        surfaces and defining a first aperture and a second aperture        that is adjacent to the first aperture, the first aperture        surrounding at least a part of each of the first source        electrode and the first drain electrode, the second aperture        surrounding at least a part of each of the second source        electrode and the second drain electrode; and    -   forming a first semiconductor layer with respect to the first        aperture and a second semiconductor layer with respect to the        second aperture by applying semiconductor material with respect        to the corresponding aperture and drying the semiconductor        material so applied, wherein (i) the first semiconductor layer        is formed so as to be in contact with the first source electrode        and the first drain electrode, and (ii) the second semiconductor        layer is formed so as to be in contact with the second source        electrode and the second drain electrode.

In the method of manufacturing a thin film transistor device pertainingto one aspect of the present invention, the partition walls are formedsuch that a bottom portion of each of the first and second aperturesincludes a source electrode portion being a bottom portion of thecorresponding source electrode and a drain electrode portion being abottom portion of the corresponding drain electrode, in plan view of thebottom portion of the first aperture, a center of a total of areas ofthe source electrode portion and the drain electrode portion is offsetfrom a center of area of the bottom portion in a direction opposite adirection of the second aperture, and in plan view of the bottom portionof the second aperture, a center of a total of areas of the sourceelectrode portion and the drain electrode portion is offset from acenter of area of the bottom portion in a direction opposite a directionof the first aperture.

According to this method, at the bottom portion of the first aperture,the source electrode portion and the drain electrode portion aredisposed so as to be offset in the direction opposite the direction ofthe second aperture; and at the bottom portion of the second aperture,the source electrode portion and the drain electrode portion aredisposed so as to be offset in the direction opposite the direction ofthe first aperture. Due to this, when the application (dropping) ofsemiconductor material (semiconductor ink) with respect to the first andsecond apertures is performed in the forming of the first and secondsemiconductor layers, a portion having greatest height of the surface ofthe semiconductor ink applied with respect to the first aperture isbiased in the direction opposite the second aperture with certainty, anda portion having greatest height of the surface of the semiconductor inkapplied with respect to the second aperture is biased in the directionopposite the first aperture with certainty. As such, the semiconductorink dropped with respect to the first aperture and the semiconductor inkdropped with respect to the second aperture are prevented from meetingand blending with each other.

Accordingly, by preventing semiconductor ink applied with respect to thefirst aperture and semiconductor ink applied with respect to the secondaperture from meeting and blending each other with certainty, a thinfilm transistor device having high quality can be manufactured.

In the method of manufacturing a thin film transistor device pertainingto one aspect of the present invention, the partition walls may beformed such that at the bottom portion of the first aperture, a portionexists where the source electrode portion and the drain electrodeportion do not exist and thus, where the insulating layer is to come indirect contact with the first semiconductor layer, the portion beingwithin an area of the bottom portion located in the direction of thesecond aperture, and at the bottom portion of the second aperture, aportion exists where the source electrode portion and the drainelectrode portion do not exist and thus, where the insulating layer isto come in direct contact with the second semiconductor layer, theportion being within an area of the bottom portion located in thedirection of the first aperture. According to this method, thesemiconductor ink dropped with respect to each of the first and secondapertures can be controlled such that the surface of the semiconductorink exhibits the above-described state with higher certainty. As such,the semiconductor ink dropped with respect to the first aperture and thesemiconductor ink dropped with respect to the second aperture areprevented from meeting and blending with each other with highercertainty.

In the method of manufacturing a thin film transistor device pertainingto one aspect of the present invention, the partition walls may beformed such that at the bottom portion of the first aperture, theportion where the source electrode portion and the drain electrodeportion do not exist and thus, where the insulating layer is to come indirect contact with the first semiconductor layer, also exists within anarea of the bottom portion located in the direction opposite thedirection of the second aperture, and in plan view, the portion occupiesa greater area at the area of the bottom portion located in thedirection of the second aperture than at the area of the bottom portionlocated in the direction opposite the direction of the second aperture,and at the bottom portion of the second aperture, the portion where thesource electrode portion and the drain electrode portion do not existand thus, where the insulating layer is to come in direct contact withthe second semiconductor layer, also exists within an area of the bottomportion located in the direction opposite the direction of the firstaperture, and in plan view, the portion occupies a greater area at thearea of the bottom portion located in the direction of the firstaperture than at the area of the bottom portion located in the directionopposite the direction of the first aperture. According to this method,the semiconductor ink dropped with respect to each of the first andsecond apertures can be controlled such that the surface of thesemiconductor ink exhibits the above-described state with even highercertainty. As such, the semiconductor ink dropped with respect to thefirst aperture and the semiconductor ink dropped with respect to thesecond aperture are prevented from meeting and blending with each otherwith certainty.

In the method of manufacturing a thin film transistor device pertainingto one aspect of the present invention, the forming of the insulatinglayer, the forming of the first and second source electrodes and thefirst and second drain electrodes, the forming of the partition walls,and the forming of the first and second semiconductor layers may beperformed such that a liquid repellency of the surfaces of the partitionwalls is greater than a liquid repellency of a surface of the insulatinglayer that is to come in contact with the first and second semiconductorlayers, and the liquid repellency of the surface of the insulating layeris greater than a liquid repellency of a surface of each of the firstand second source electrodes and each of the first and second drainelectrodes. By controlling the liquid repellency of each of the elementsas described above, semiconductor ink applied with respect to the firstaperture and semiconductor ink applied with respect to the secondaperture are prevented from meeting and blending with each other witheven higher certainty. As such, a thin film transistor device havinghigh quality can be manufactured with certainty.

Note that in the above, when a given element is “on” or “above” anotherelement, the given element is not limited to being disposed in theabsolutely vertical direction with respect to the other element.Instead, in the present disclosure, the terms “on” and “above” are usedto indicate the relative positions of different elements, or morespecifically, the relative positions of different elements along thedirection in which such elements are layered. Further, in the presentdisclosure, the term “on” or “above” are each used to indicate not onlyone but both of a state where a gap exists between two elements and astate where the two elements are in close contact with each other.

In the following, explanation is provided of characteristics of variousforms of implementation and the effects achieved thereby, with referenceto several specific examples thereof. Further, note that although thefollowing embodiments include description on fundamental characteristicfeatures, the present disclosure is not to be construed as being limitedto the description provided in the following embodiments other than suchfundamental features.

Embodiment 1 1. Overall Structure of Organic EL Display Device 1

In the following, description is provided on a structure of an organicEL display device 1 pertaining to embodiment 1 of the presentdisclosure, with reference to FIG. 1.

As illustrated in FIG. 1, the organic EL display device 1 includes anorganic EL display panel 10 and a drive control circuit portion 20connected to the organic EL display panel 10.

The organic EL display panel 10 is a panel that makes use ofelectroluminescence of organic material. The organic EL display panel 10is composed of a plurality of organic EL elements that are, forinstance, arranged so as to form a matrix. The drive control circuitportion 20 includes four drive circuits, namely drive circuits 21through 24, and a control circuit 25.

Note that, in the organic EL display device 1 pertaining to the presentembodiment, the positional arrangement of the drive control circuitportion 20 with respect to the organic EL display panel 10 is notlimited to that illustrated in FIG. 1.

2. Structure of Organic EL Display Panel 10

In the following, description is provided on a structure of the organicEL display panel 10, with reference to the schematic cross-sectionalview of FIG. 2, and FIGS. 3A and 3B.

As illustrated in FIG. 2, the organic EL display panel 10 includes athin film transistor (TFT) substrate 101. The TFT substrate 101 has astructure where gate electrodes 1012 a, 1012 b are layered on asubstrate 1011 with a gap between one another, and an insulating layer1013 is layered so as to cover the substrate 1011 and the gateelectrodes 1012 a, 1012 b. On the insulating layer 1013, sourceelectrodes 1014 a, 1014 b, respectively corresponding to the gateelectrodes 1012 a, 1012 b are disposed. Further, as illustrated in FIG.3A, drain electrodes 1014 c, 1014 d are disposed on the insulating layer1013. The drain electrodes 1014 c, 1014 d respectively correspond to thesource electrodes 1014 a, 1014 b, and are each disposed so as to belocated apart from a corresponding one of the source electrodes 1014 a,1014 b in the Y axis direction with a gap therebetween.

In addition, as illustrated in FIG. 2 and FIG. 3A, a connection wire1015 is disposed on the insulating layer 1013 at the left side of thesource electrode 1014 a in the X axis direction, and such that there isa gap between the connection wire 1015 and the source electrode 1014 a.The connection wire 1015 is formed by extending the source electrode1014 a or the drain electrode 1014 c. Alternatively, the connection wire1015 is electrically connected to the source electrode 1014 a or thedrain electrode 1014 c.

Further, as illustrated in FIGS. 2 and 3A, partition walls 1016 aredisposed on the insulating layer 1013. The partition walls 1016 surround(a) the connection wire 1015, (b) a combination of the source electrode1014 a and the drain electrode 1014 c, and (c) a combination of thesource electrode 1014 b and the drain electrode 1014 d, in such a mannerthat (a), (b), and (c) are separated from one another by beingsurrounded by the partition walls 1016. In other words, as illustratedin FIG. 3A, the partition walls 1016 define three apertures, namely anaperture 1016 a, an aperture 1016 b, and an aperture 1016 c. Theaperture 1016 a at the far left side in the X axis direction has abottom portion where the connection wire 1015 remains exposed. Theaperture 1016 a is not a channel portion and functions as a contactportion that contacts an anode. On the other hand, the aperture 1016 bhas a bottom portion where the source electrode 1014 a and the drainelectrode 1014 c remain exposed, and the aperture 1016 c has a bottomportion where the source electrode 1014 b and the drain electrode 1014 dremain exposed. The apertures 1016 b and 1016 c function as channelportions.

In addition, as illustrated in FIG. 3B, at each of the bottom portionsof the apertures 1016 b, 1016 c, the corresponding one of the sourceelectrodes 1014 a, 1014 b and the corresponding one of the drainelectrodes 1014 c, 1014 d (refer to FIG. 3A for illustration) are notdisposed so as to extend entirely across the bottom portion in the Xaxis direction. That is, at the bottom portion of the aperture 1016 b, aportion of the insulating layer 1013 remains exposed at a left side ofthe bottom portion in the X axis direction (such portion hereinafterreferred to as an exposed portion 1013 a). Similarly, at the bottomportion of the aperture 1016 c, a portion of the insulating layer 1013remains exposed at a right side of the bottom portion in the X axisdirection (such portion hereinafter referred to as an exposed portion1013 b).

Returning to FIG. 2, within the aperture 1016 b defined by the partitionwalls 1016, an organic semiconductor layer 1017 a is disposed on thesource electrode 1014 a and the drain electrode 1014 c included therein.Similarly, within the aperture 1016 c defined by the partition walls1016, an organic semiconductor layer 1017 b is disposed on the sourceelectrode 1014 b and the drain electrode 1014 d. More specifically, theorganic semiconductor layer 1017 a is formed so as to cover the sourceelectrode 1014 a and the drain electrode 1014 c and also fill a gapbetween the source electrode 1014 a and the drain electrode 1014. Theorganic semiconductor layer 1017 a so formed is in contact with thesource electrode 1014 a and the drain electrode 1014 c. The organicsemiconductor layer 1017 b is formed in a similar manner and is incontact with the source electrode 1014 b and the drain electrode 1014 d.Further, the organic semiconductor layer 1017 a and the organicsemiconductor layer 1017 b are partitioned from each other by thepartition walls 1016.

Here, note that the organic semiconductor layer 1017 a is in directcontact with the insulating layer 1013 at the exposed portion 1013 aillustrated in FIG. 3B, without the source electrode 1014 a or the drainelectrode 1014 c existing therebetween. Similarly, the organicsemiconductor layer 1017 b is in direct contact with the insulatinglayer 1013 at the exposed portion 1013 b illustrated in FIG. 3B, withoutthe source electrode 1014 b or the drain electrode 1014 d existingtherebetween. Also refer to FIG. 2 for illustration of the above.

Further, as illustrated in FIG. 2, a passivation film 1018 is disposedso as to cover the organic semiconductor layer 1017 a, the organicsemiconductor layer 1017 b, and the insulating layer 1013. However, itshould be noted that the passivation film 1018 is not disposed above thearea corresponding to the connection wire 1015, and therefore, anopening is formed at such an area.

The TFT substrate 101 of the organic EL display panel 10 pertaining tothe present embodiment has a structure as described up to this point.

Next, as illustrated in FIG. 2, a planarizing film 102 covers the TFTsubstrate 101 from above. However, it should be noted that theplanarizing film 102 does not cover the connection wire 1015, and acontact hole 102 a is formed in the planarizing film 102 at an areaabove the connection wire 1015. The contact hole 102 a is incommunication with the aperture 1016 a of the TFT substrate 101.

An anode 103, a light-transmissive conduction film 104, and a holeinjection layer 105 are disposed in the stated order on a main surfaceof the planarizing film 102. Here, each of the anode 103, thelight-transmissive conduction film 104, and the hole injection layer 105is disposed not only on the planarizing film 102 but also along a sidesurface of the planarizing film 102 defining the contact hole 102 a. Theanode 103 is in contact with and electrically connected to theconnection wire 1015.

Further, banks 106 are disposed on the hole injection layer 105. Thebanks 106 are disposed so as to surround an area above the holeinjection layer 105 that corresponds to a light-emitting portion (i.e.,a subpixel). In an opening formed at the above-described area by thebanks 106, a hole transport layer 107, an organic light-emitting layer108, and an electron transport layer 109 are disposed in the statedorder.

On the electron transport layer 109 and on exposed surfaces of the banks106, a cathode 110 and a sealing layer 111 are disposed in the statedorder so as to cover the electron transport layer 109 and the exposedsurfaces of the banks 106. Further, a color filter (CF) substrate 113 isarranged so as to face the sealing layer 111. The sealing layer 111 andthe CF substrate 113 are joined together by an adhesion layer 112filling a gap therebetween. The CF substrate 113 includes a substrate1131, and a color filter 1132 and a black matrix 1133 disposed on a mainsurface of the substrate 1131. The main surface of the substrate 1131 isa surface of the substrate 1131 that is located lower in the Z axisdirection.

3. Material Constituting Organic EL Display Panel 10

Each part of the organic EL display panel 10 may, for instance, beformed by using the materials as described in the following.

(i) Substrate 1011

The substrate 1011 may be, for instance: a glass substrate; a quartzsubstrate; a silicon substrate; a metal substrate composed of, forexample, molybdenum sulfide, copper, zinc, aluminum, stainless steel,magnesium, iron, nickel, gold, or silver; a semiconductor substratecomposed of, for example, gallium arsenide; or a plastic substrate.

Examples of material constituting the plastic substrate includethermoplastic resins and thermosetting resins. Examples thereof includepolyolefins, such as polyethylene, polypropylene, ethylene-propylenecopolymers, and ethylene-vinyl acetate copolymers (EVA), cyclicpolyolefin, modified polyolefins, polyvinyl chloride, polyvinylidenechloride: polystyrene, polyamide, polyimide (PI), polyamide-imide,polyesters, such as polycarbonate, poly(4-methylpentene-1), ionomers,acrylic-based resins, polymethyl methacrylater acrylic-styrenecopolymers (AS resins), butadiene-styrene copolymers, ethylene vinylalcohol copolymers (EVOH), polyethylene terephthalate (PET),polybutylene terephthalate, polyethylene naphthalate (PEN), andpolycyclohexane terephthalate (PCT), polyether, polyether ketone,polyethersulfone (PES), polyether imide, polyacetal, polyphenyleneoxide, modified polyphenylene oxide, polyarylate, aromatic polyesters(liquid crystal polymer), polytetrafluoroethylene, polyvinylidenefluoride, other fluorocarbon resins, thermoplastic elastomers, such asstyrene-based elastomers, polyolefin-based elastomers, polyvinylchloride-based elastomers, polyurethane-based elastomers, fluorocarbonrubbers, and chlorinated polyethylene-based elastomers, epoxy resins,phenolic resins, urea resins, melamine resins, unsaturated polyesters,silicone resins, and polyurethane, and copolymers, blends, and polymeralloys thereof. The plastic substrate may be a single layer substratecomposed of one of the materials described above or a multilayersubstrate having layers composed of two or more materials.

(ii) Gate Electrodes 1012 a, 1012 b

The gate electrodes 1012 a, 1012 b may be made of, for instance, anymaterial having electrical conductivity.

Specific examples thereof include metals, such as chromium, aluminum,tantalum, molybdenum, niobium, copper, silver, gold, platinum,palladium, indium, nickel, and neodymium, and alloys thereof; conductivemetal oxides, such as zinc oxide, tin oxide, indium oxide, and galliumoxide; conductive metal complex oxides, such as indium tin complex oxide(ITO), indium zinc complex oxide (IZO), aluminum zinc complex oxide(AZO), and gallium zinc complex oxide (GZO); conductive polymers, suchas polyaniline, polypyrrole, polythiophene, and polyacetylene, andconductive polymers doped with acids, e.g., hydrochloric acid, sulfuricacid, and sulfonic acid, Lewis acids, e.g., phosphorus pentafluoride,arsenic pentafluoride, and iron chloride, halogen elements, e.g.,iodine, and metals, e.g., sodium and potassium; and conductive compositematerials containing carbon black and metal particles dispersed.Alternatively, polymer mixtures containing conductive particles, such asfine metal particles and graphite, may be used. These materials may beused alone or in combination.

(iii) Insulating Layer 1013

The insulating layer 1013 functions as a gate insulating layer. Theinsulating layer 1013 may be made, for instance, of any material havinginsulative properties. Examples of the material that can be used includeorganic insulating materials and inorganic insulating materials.

Examples of organic insulating materials include acrylic resins,phenolic resins, fluororesins, epoxy resins, imide resins, and novolactype resins.

Examples of inorganic insulating materials include: metal oxides, suchas silicon oxide, aluminum oxide, tantalum oxide, zirconium oxide,cerium oxide, zinc oxide, and cobalt oxide; metal nitrides, such assilicon nitride, aluminum nitride, zirconium nitride, cerium nitride,zinc nitride, cobalt nitride, titanium nitride, and tantalum nitride;and metal complex oxides, such as barium strontium titanate and leadzirconate titanate. These may be used alone or in combination.

Further, the insulating layer 1013 may have a surface thereof processedby using a surface treatment agent (ODTS OTS HMDS βPTS) or the like.

(iv) Source Electrodes 1014 a, 1014 b, and Drain Electrodes 1014 c, 1014d

The source electrodes 1014 a, 1014 b and the drain electrodes 1014 c,1014 d can be formed by using the same materials as used for forming thegate electrodes 1012 a, 1012 b.

(v) Organic Semiconductor Layers 1017 a, 1017 b

The organic semiconductor layers 1017 a, 1017 b may be formed by using,for instance, any material that has semiconducting properties and issoluble to a solvent. Specific examples thereof include thiophene-basedmaterials, such as poly(3-alkylthiophene), poly(3-hexylthiophene)(P3HT), poly(3-octylthiophene), poly(2,5-thienylene vinylene) (PTV),quarterthiophene (4T), sexithiophene (6T), octathiophene,2,5-bis(5′-biphenyl-2′-thienyl)thiophene (BPT3),2,5-[2,2′-(5,5′-diphenyl)dithienyl]thiophene, and[5,5′-bis(3-dodecyl-2-thienyl)-2,2′-bithiophene] (PQT-12); phenylenevinylene-based materials such as poly(paraphenylene vinylene) (PPV);fluorene-based materials such as poly(9,9-dioctylfluorene) (PFO);triallylamine-based polymers; acene-based materials, such as anthracene,tetracene, pentacene, and hexacene; benzene-based materials, such as1,3,5-tris[(3-phenyl-6-trifluoromethyl)quinoxalin-2-yl]benzene (TPQ1)and1,3,5-tris[{3-(4-tert-butylphenyl)-6-trisfluoromethyl}quinoxalin-2-yl]benzene(TPQ2); phthalocyanine-based materials, such as phthalocyanine, copperphthalocyanine (CuPc), iron phthalocyanine, and perfluorophthalocyanine;organometallic materials, such as tris(8-hydroxyquinoline) aluminum(Alq3) and fac-tris(2-phenylpyridine) iridium (Ir(ppy)3); C60; polymers,such as, oxadiazole-based polymers, triazole-based polymers,carbazole-based polymers, and fluorene-based polymers;poly(9,9-dioctylfluorene-co-bis-N,N′-(4-methoxyphenyl)-bis-N,N′-phenyl-1,4-phenylenediamine)(PFMO); poly(9,9-dioctylfluorene-co-benzothiadiazole) (BT);fluorene-triallylamine copolymers; and copolymers of fluorene andpoly(9,9-dioctylfluorene-co-dithiophene) (F8T2). These materials may bealone or in combination.

Alternatively, the organic semiconductor layers 1017 a, 1017 b may beformed by using an inorganic material that is soluble in a solvent.

(v) Passivation Film 1018

The passivation film 1018 may be formed by using, for instance, a watersoluble resin such as polyvinyl alcohol (PVA), or a fluororesin.

(vii) Planarizing Film 102

The planarizing film 102 is formed by using, for instance, an organiccompound such as polyimide, polyamide, and acrylic resin material.

(viii) Anode 103

The anode 103 is made of a metal material containing silver (Ag) oraluminum (Al). Further, in a top-emission type display panel such as theorganic EL display panel 10 pertaining to the present embodiment, it isdesirable that a surface portion of the anode 103 have highreflectivity.

(ix) Light-Transmissive Conduction Film 104

The light-transmissive conduction film 104 is formed by using, forinstance, Indium Tin Oxide (ITO), Indium Zinc Oxide (IZO), or the like.

(x) Hole Injection Layer 105

The hole injection layer 105 is a layer made of, for instance, an oxideof a metal such as silver (Ag), molybdenum (Mo), chromium (Cr), vanadium(V), tungsten (W), nickel (Ni), and iridium (Ir), or a conductivepolymer material such as PEDOT (an amalgam of polythiophene andpolystyrene sulfonic acid) The hole injection layer 105 in the organicEL display panel 10 pertaining to the present embodiment as illustratedin FIG. 2 is assumed to be made of a metal oxide. In such a case, thehole injection layer 105 is provided with a function of assisting holegeneration and injecting holes into the organic light-emitting layer 108with a higher level of stability, compared to when the hole injectionlayer 105 is made of a conductive polymer material such as PEDOT. Assuch, the hole injection layer 105, when made of a metal oxide, has ahigher work function than the hole injection layer 105, when made of aconductive polymer material.

Here, a case where the hole injection layer 105 is made of an oxide of atransition metal is considered. In such a case, a plurality of levelscan be occupied since there are a plurality of oxidation numbers. Thismakes hole injection easy and allows for reduction of driving voltage Itis particularly desirable to form the hole injection layer 105 by usingtungsten oxide (WO_(X)) since the hole injection layer 105 can beprovided with the function of stably injecting holes and assisting thegeneration of holes.

(xi) Banks 106

The banks 106 are formed by using an organic material such as resin andhave insulative properties. Example of organic material usable forforming the banks 106 include acrylic resins, polyimide resins, andnovolac type phenolic resin. In addition, it is desirable that the banks106 have organic solvent resistance. Further, since the banks 106 mayundergo processes such as etching, baking, etc. when being formed, it isdesirable that the banks 106 be formed from highly resistant materialthat will not change excessively in shape or quality during suchprocesses. In addition, to provide the banks 106 with liquid repellency,the surfaces thereof can be fluoridated.

This is since, if a liquid-philic material is used to form the banks106, the difference in liquid philicity/liquid repellency between thesurfaces of the banks 106 and the surface of organic light-emittinglayer 108 becomes small, and it thus becomes difficult to keep inkincluding an organic substance for forming the organic light-emittinglayer 108 to be selectively held within the apertures defined by thebanks 106.

In addition, the banks 106 need not be formed so as to have asingle-layer structure as shown in FIG. 2. That is, the banks 106 may bealternatively formed so as to have a structure including two or morelayers. In such a case, the above materials may be combined for eachlayer, or layers may alternate between inorganic and organic material.

(xii) Hole Transport Layer 107

The hole transport layer 107 is formed by using a high-molecularcompound not containing a hydrophilic group. For instance, the holetransport layer 107 may be formed by using a high-molecular compoundsuch as polyfluorene or a derivative thereof, and polyallylamine or aderivative thereof, but not containing a hydrophilic group.

(xiii) Organic Light-Emitting Layer 108

The organic light-emitting layer 108 has a function of emitting lightwhen an excitation state is produced by the recombination of holes andelectrons injected thereto. It is desirable that material used to formthe organic light-emitting layer 108 is a light emitting-organicmaterial, a film of which can be formed by wet printing.

Specifically, it is desirable that the organic light-emitting layer 108be formed from a fluorescent material such as an oxinoid compound,perylene compound, coumarin compound, azacoumarin compound, oxazolecompound, oxadiazole compound, perinone compound, pyrrolo-pyrrolecompound, naphthalene compound, anthracene compound, fluorene compound,fluoranthene compound, tetracene compound, pyrene compound, coronenecompound, quinolone compound and azaquinolone compound, pyrazolinederivative and pyrazolone derivative, rhodamine compound, chrysenecompound, phenanthrene compound, cyclopentadiene compound, stilbenecompound, diphenylquinone compound, styryl compound, butadiene compound,dicyanomethylene pyran compound, dicyanomethylene thiopyran compound,fluorescein compound, pyrylium compound, thiapyrylium compound,selenapyrylium compound, telluropyrylium compound, aromatic aldadienecompound, oligophenylene compound, thioxanthene compound, anthracenecompound, cyanine compound, acridine compound, metal complex of a8-hydroxyquinoline compound, metal complex of a 2-bipyridine compound,complex of a Schiff base and a group three metal, metal complex ofoxine, rare earth metal complex, etc., as recited in Japanese PatentApplication Publication No. H5-163488.

(xiv) Electron Transport Layer 109

The electron transport layer 110 has a function of transportingelectrons injected through the cathode 111 to the organic light-emittinglayer 108, and is formed by using, for instance, an oxadiazolederivative (OXD), a triazole derivative (TAZ), a phenanthrolinederivative (BCP, Bphen), or the like.

(xv) Cathode 110

The cathode 110 is formed by using, for instance, Indium Tin Oxide(ITO), Indium Zinc Oxide (IZO), or the like. Further, in a top-emissiontype display panel such as the organic EL display panel 10 pertaining tothe present embodiment, it is desirable that the cathode 110 be formedby using light-transmissive material. When forming the cathode 111 byusing light-transmissive material as described above, it is desirablethat the cathode 111 be provided with light-transmissivity of 80% orgreater.

In addition to the materials presented above, the following materialsmay be used to form the cathode 110. That is, the cathode 110 may beformed, for instance, as a layer including an alkali metal, a layerincluding an alkali earth metal, or a layer including an alkali earthmetal halide. Alternatively, the cathode 110 may be formed as a laminateincluding one of the above-described layers and a layer including Aglaminated in the stated order. When the cathode 110 is formed as alaminate as described above, the layer including Ag may be formed withAg alone, or with an alloy of Ag. Further, in order to enhance theefficiency with which light is guided out from the organic EL displaypanel 10, a highly light-transmissive, refraction index adjustment layermay be provided above the layer including Ag.

(xvi) Sealing Layer 111

The sealing layer 111 has a function of preventing organic layers suchas the organic light-emitting layer 108 from being exposed to waterand/or air and is formed by using, for example, material such as siliconnitride (SiN) and silicon oxynitride (SiON). In addition, a sealingresin layer made of a resin material such as acrylic resin and siliconeresin may be further disposed above the sealing layer, which is formedby using material such as silicon nitride (SiN) and siliconoxynitride-(SiON) as described above.

Further, in a top-emission type display panel such as the organic ELdisplay panel 10 pertaining to the present embodiment, it is desirablethat the sealing layer 111 be formed by using light-transmissivematerial.

4. Arrangement of Source Electrodes 1014 a, 1014 b and Drain Electrodes1014 c, 1014 d in TFT Substrate 101

In the following, description is provided on a positional arrangement ofthe source electrodes 1014 a, 1014 b and the drain electrodes 1014 c,1014 d in the TFT substrate 101, with reference to FIGS. 3A and 3B.

As illustrated in FIGS. 3A and 3B, at the bottom portion of each of theapertures 1016 b, 1016 c defined by the partition walls 1016, thecorresponding one of the source electrodes 1014 a, 1014 b and thecorresponding one of the drain electrodes 1014 c, 1014 d are notdisposed so as to extend from side to side in the X axis direction.Rather, at the bottom portion of the aperture 1016 b, each of the sourceelectrode 1014 a and the drain electrode 1014 c is disposed so as to beoff-center in one direction along the X axis, whereas, at the bottomportion of the aperture 1016 c, each of the source electrode 1014 b andthe drain electrode 1014 d is disposed so as to be off-center in theopposite direction along the X axis. In specific, at the bottom portionof the aperture 1016 b, each of the source electrode 1014 a and thedrain electrode 1014 c is disposed so as to be offset in the leftdirection along the X axis.

On the other hand, at the bottom portion of the aperture 1016 c, each ofthe source electrode 1014 b and the drain electrode 1014 d is disposedso as to be offset in the right direction along the X axis.

Due to this, as illustrated in FIG. 3A, at the bottom portion of theaperture 1016 b, a line L₃ passing through a center of a total of areasof the source electrode 1014 a and the drain electrode 1014 c is offsetin the left direction along the X axis from a line L₁ passing through acenter of area of the bottom portion of the aperture 1016 b in the Xaxis direction by a distance x₁. Similarly, as illustrated in FIG. 3A,at the bottom portion of the aperture 1016 c, a line L₄ passing througha center of a total of areas of the source electrode 1014 b and thedrain electrode 1014 d is offset in the right direction along the X axisfrom a line L₂ passing through a center of area of the bottom portion ofthe aperture 1016 c in the X axis direction by a distance x₂.

Note that each of “a center of a total of areas of the source electrode1014 a and the drain electrode 1014 c (areas of upper surfaces of thesource electrode 1014 a and the drain electrode 1014 c illustrated inFIG. 3A)” and “a center of a total of areas of the source electrode 1014b and the drain electrode 1014 d (areas of upper surfaces of the sourceelectrode 1014 b and the drain electrode 1014 d illustrated in FIG. 3A)”as mentioned above can be calculated according to Math. 1 above.

In addition, at the bottom portion of the aperture 1016 b, each of thesource electrode 1014 a and the drain electrode 1014 c is in contactwith a side surface portion, facing the aperture 1016 b, of thepartition walls 1016 at a left side thereof in the X axis directionwhile being located apart from the side surface portion facing theaperture 1016 b at a right side thereof in the X axis direction.Similarly, at the bottom portion of the aperture 1016 c, each of thesource electrode 1014 b and the drain electrode 1014 d is in contactwith a side surface portion, facing the aperture 1016 c, of thepartition walls 1016 at a right side thereof in the X axis directionwhile being located apart from the side surface portion facing theaperture 1016 c at a left side thereof in the X axis direction.

Further, as illustrated in FIG. 3B, at a point when the organicsemiconductor layer 1017 a has not yet been formed, at the bottomportion of the aperture 1016 b, the portion of the insulating layer 1013remaining exposed (i.e., the exposed portion 1013 a) occupies a greaterarea in the right side of the bottom portion of the aperture 1016 b inthe X axis direction compared to in the left side. Similarly, at a pointwhen the organic semiconductor layer 1017 b has not yet been formed, atthe bottom portion of the aperture 1016 c, the portion of the insulatinglayer 1013 remaining exposed (i.e., the exposed portion 1013 b) occupiesa greater area in the left side of the bottom portion of the aperture1016 c in the X axis direction compared to in the right side.

5. Method of Manufacturing Organic Display Device 1

In the following, description is provided on a method of manufacturingthe organic EL display device 1, and in particular, a method ofmanufacturing the organic EL display panel 10, with reference to FIG. 2and FIGS. 4A and 4B.

First, as illustrated in FIG. 2 and FIG. 4A, the substrate 1011 isprepared (Step S1). The substrate 1011 serves as a base of the TFTsubstrate 101. Then, the TFT substrate 101 is formed by forming a thinfilm transistor (TFT) element on the substrate 1011 (Step S2).

Then, as illustrated in FIG. 2 and FIG. 4A, the planarizing film 102,which is made of insulative material, is formed on the TFT substrate 101(Step S3). As illustrated in FIG. 2, the planarizing film 102 has thecontact hole 102 a formed therein at an area above the connection wire1015 in the TFT substrate 101. Further, the planarizing film 102 isformed such that upper surfaces in the Z axis direction of portionsthereof other than the contact hole 102 a are substantially planar.

Then, the anode 103 is formed on the planarizing film 102 (Step S4). Asillustrated in FIG. 2, the anode 103 in the organic EL display panel 10is formed so as to be partitioned in units of light emission (i.e., inunits of subpixels). Further, the anode 103 is formed so as to have aportion that is connected to the connection wire 1015 of the TFTsubstrate 101 by being formed along the side surface of the planarizingfilm 102 defining the contact hole 102 a.

Here, note that the anode 103 can be formed, for instance, by firstforming a metal film according to the sputtering method, the vacuumvapor deposition method, or the like, and then etching the metal film soformed to obtain subpixel units.

Then, the light-transmissive conduction film 104 is formed so as tocover an upper surface of the anode 103 (Step S5). As illustrated inFIG. 2, the light-transmissive conduction film 104 covers not only theupper surface of the anode 103 but also surfaces of lateral edges of theanode 103. Further, the light-transmissive conduction film 104 alsocovers the upper surface of the anode 103 within the contact hole 102 a.Note that the light-transmissive conduction film 104 can also be formed,for instance, by first forming a film according to the sputteringmethod, the vacuum vapor deposition method, or the like, and thenetching the film so formed to obtain subpixel units.

Then, the hole injection layer 105 is formed on the light-transmissiveconduction film 104 (Step S6). Note that, although the hole injectionlayer 105 is formed so as to cover the entire light-transmissiveconduction film 104 in FIG. 2, the hole injection layer 105 mayalternatively be formed so as to be partitioned into subpixel units.

Further, when forming the hole injection layer 105 by using a metaloxide (e.g., tungsten oxide), the formation of the metal oxide film canbe performed according to specific film forming conditions. Forinstance, the metal oxide film can be formed under film formingconditions such that: (i) a gas including argon gas and oxygen gas isused as a sputtering gas in a chamber of a sputtering device for formingthe metal oxide film; (ii) a total pressure of the sputtering gas ishigher than 2.7 Pa and lower than or equal to 7.0 Pa; (iii) a partialpressure of the oxygen gas in the sputtering gas is at least 50% and atmost 70%; and (iv) an input power density per unit area of thesputtering target is at least 1.0 W/cm² and at most 2.8 W/cm².

Then, the banks 106 defining subpixels of the organic EL display panel10 are formed (Step S7). As illustrated in FIG. 2, the banks 106 areformed so as to be layered onto the hole injection layer 105.

In specific, the banks 106 are formed by first forming a layer ofmaterial for forming the banks 106 (hereinafter referred to as a“material layer”) on the hole injection layer 105. The material layer isformed, for instance, by using a material including a photosensitiveresin component and a fluorine component such as acrylic resin,polyimide resin, and novolac-type phenolic resin, and according to thespin coating method, or the like. Note that, in the present embodiment,a negative photosensitive material manufactured by Zeon Corporation(product code: ZPN1168), which is one example of a photosensitive resinmaterial, can be used for forming the material layer. Subsequently, bypatterning the material layer so formed, apertures corresponding to thesubpixels of the organic EL display panel 10 are formed. The forming ofthe apertures can be performed by disposing a mask onto the surface ofthe material layer, performing exposure from over the mask, and finallyperforming developing.

Then, in each concavity on the hole injection layer 105 defined by thebanks 106, the hole transport layer 107, the organic light-emittinglayer 108, and the electron transport layer 109 are formed in the statedorder so as to be layered one on top of another (Steps S8 through S10).

The hole transport layer 107 is formed by first forming, according tothe printing method, a film made of an organic compound for forming thehole transport layer 107, and then sintering the film so formed. Theorganic light-emitting layer 108 is similarly formed by first forming afilm according to the printing method, and then sintering the film soformed.

Then, the cathode 110 and the sealing layer 111 are layered onto theelectron transport layer 109 in the stated order (Steps S11 and S12). Asillustrated in FIG. 2, the cathode 110 and the sealing layer 111 areformed so as to cover the layers therebelow entirely, including topsurfaces of the banks 106.

Then, an adhesive resin material for forming the adhesion layer 112 isapplied onto the sealing layer 111, and a color filter (CF) panel havingbeen prepared in advance is adhered onto the sealing layer 111 via theadhesive layer 112 (Step S13). As illustrated in FIG. 2, the CFsubstrate 113 adhered onto the sealing layer 111 via the adhesion layer112 includes the substrate 1131, and the color filter 1132 and the blackmatrix 1133 formed on the surface of the substrate 1131 that is locatedlower in the Z axis direction.

As such, the manufacturing of the organic EL display panel 10, which isan organic EL display element, is completed.

Note that, although illustration is not provided in the drawings, themanufacturing of the organic EL display device 1 is completed byannexing the drive control circuit portion 20 to the organic EL displaypanel 10 (refer to FIG. 1), and then performing aging processing. Theaging processing is performed by, for instance, causing the organic ELdisplay device 1 to conduct until the mobility of holes in the organicEL display device 1 reaches 1/10 or lower with respect to the holeinjection characteristics before the aging processing. Morespecifically, in the aging processing, the organic EL display device 1is electrified for a predetermined time period while maintaining theluminous intensity of the organic EL display device 1 to be at leastequal to the luminous intensity upon actual usage and at most threetimes the luminous intensity upon actual usage.

Subsequently, description is provided on a method of forming the TFTsubstrate 101, with reference to FIG. 4B, FIGS. 5A through 5C, FIGS. 6Athrough 6C, FIGS. 7A through 7C, and FIGS. 8A and 8B.

As illustrated in FIG. 5A, the gate electrodes 1012 a, 1012 b are formedon a main surface of the substrate 1011 (Step S21 in FIG. 4B). Note thatthe formation of the gate electrodes 1012 a, 1012 b may be performedaccording to the above-described method applied in the formation of theanode 103.

Then, as illustrated in FIG. 5B, the insulating layer 1013 is formed soas to cover the substrate 1011 and the gate electrodes 1012 a, 1012 b(Step S22 in FIG. 4B). Then, as illustrated in FIG. 5C, the sourceelectrodes 1014 a, 1014 b, the drain electrodes 1014 c, 1014 d, and theconnection wire 1015 are formed on a main surface of the insulatinglayer 1013 (Step S23 in FIG. 4B). In this step, note that the positionof each of the source electrodes 1014 a, 1014 b and each of the drainelectrodes 1014 c, 1014 d on the insulating layer 1013 is defined suchthat, in each of the apertures 1016 b, 1016 c, a corresponding one ofthe source electrodes 1014 a, 1014 b and the corresponding one of thedrain electrodes 1014 c, 1014 d are disposed so as to be offset in themanner described above. Such arrangements are made in the present steptaking into account the partition walls 1016 that are formed through thefollowing steps. Further, due to the source electrodes 1014 a, 1014 band the drain electrodes 1014 c, 1014 d being formed as described above,the exposed portion 1013 a of the insulating layer 1013 is formed at theright side of the source electrode 1014 a and the drain electrode 1014 c(undepicted in FIG. 5C) in the X axis direction, and the exposed portion1013 b of the insulating layer 1013 is formed at the left side of thesource electrode 1014 b and the drain electrode 1014 d (undepicted inFIG. 5C) in the X axis direction.

Then, as illustrated in FIG. 6A, a film 10160 of photoresist materialfor forming the partition walls 1016 is deposited so as to accumulateand cover the source electrodes 1014 a, 1014 b; the drain electrodes1014 c, 1014 d, the connection wire 1015, and the exposed portions 1013a, 1013 b of the insulating layer 1013 (Step S24 in FIG. 4B). Then, asillustrated in FIG. 6B, a mask 501 is disposed above the film 10160 sodeposited, and mask exposure and patterning of the photoresist materialfilm 10160 is performed (Step S25 in FIG. 4B). Here, note that the mask501 has window portions 501 a, 501 b, 501 c, and 501 d formed thereinwhich correspond in position to the partition walls 1016 to be formed.Note that, although not illustrated in FIG. 6B, the mask 501 hasadditional window portions formed therein which also correspond inposition to the partition walls 1016 to be formed.

The partition walls 1016, illustration of which is provided in FIG. 6C,are formed in such a manner as described above (Step S26 in FIG. 4B).The partition walls 1016 define a plurality of apertures including theapertures 1016 a, 1016 b, and 1016 c. At the bottom portion of theaperture 1016 a, the partition walls 1016 defining the aperture 1016 asurround the connection wire 1015. At the bottom portion of the aperture1016 b, the partition walls 1016 defining the aperture 1016 b surroundthe source electrode 1014 a and the drain electrode 1014 c (undepictedin FIG. 6C). At the bottom portion of the aperture 1016 c, the partitionwalls 1016 defining the aperture 1016 c surround the source electrode1014 b and the drain electrode 1014 d (undepicted in FIG. 6C). Further,at the bottom portion of each of the apertures 1016 b, 1016 c, thecorresponding one of the source electrodes 1014 a, 1014 b and thecorresponding one of the drain electrodes 1014 c, 1014 d (undepicted inFIG. 6C) are disposed so as to be offset in one direction along the Xaxis.

After the partition walls 1016 are formed, organic semiconductor ink10170, 10171, for respectively forming the organic semiconductor layers1017 a, 1017 b, are respectively applied to the apertures 1016 b, 1016 cdefined by the partition walls 1016, as illustrated in FIG. 7 (Step S27in FIG. 4B). Here, it should be noted that the surface shape of theorganic semiconductor ink 10170 applied with respect to the aperture1016 b is not symmetrical in the X axis direction. Rather, the surfaceshape of the organic semiconductor ink 10170 is such that a portion ofthe surface that bulges upwards the most (a portion of the surfacehaving the greatest height) is biased in the left direction along the Xaxis. On the other hand, the surface shape of the organic semiconductorink 10171 is such that a portion of the surface that bulges upwards themost (a portion of the surface having the greatest height) is biased inthe right direction along the X axis.

By controlling the surface shapes of the organic semiconductor ink10170, 10171 in such a manner, the organic semiconductor ink 10170,10171 is prevented from meeting and blending with each other. Thespecific reasons as to why such a problem can be prevented are describedlater in the present disclosure.

Subsequently, by drying the organic semiconductor ink 10170, 10171 (StepS28 in FIG. 4B), the organic semiconductor layers 1017 a, 1017 b arerespectively formed with respect to the apertures 1016 b, 1016 c asillustrated in FIG. 8A (Step S29 in FIG. 4B).

Finally, the formation of the TFT substrate 101 is completed by formingthe passivation film 1018 so as to entirely cover underlayers therebelowwith the exception of a contact area including the aperture 1016 a,etc., as illustrated in FIG. 8B (Step S30 in FIG. 4B).

6. Effects Achieved

For the reasons explained in the following, the TFT substrate 101pertaining to the present embodiment, the organic EL display panel 10including the TFT substrate 101, and the organic EL display device 1having a structure including the organic EL display panel 10 are ensuredto have high quality, and at the same time, to have high yield in themanufacture thereof.

As illustrated in FIG. 7, according to the TFT substrate 101 pertainingto the present embodiment, when the organic semiconductor ink 10170,10171, which are for respectively forming the organic semiconductorlayers 1017 a, 1017 b, are respectively applied (dropped) with respectto the apertures 1016 b, 1016 c, the surface shape of each of theorganic semiconductor ink 10170, 10171 is such that, the height of thesurface thereof is greater at one side of the corresponding one of theapertures 1016 b, 1016 c that is opposite the side of the partitionwalls 1016 between the apertures 1016 b and 1016 c. Due to this, in themanufacture of the TFT substrate 101 pertaining to the presentembodiment, the organic semiconductor ink 10170 dropped with respect tothe aperture 1016 b and the organic semiconductor ink 10171 dropped withrespect to the aperture 1016 c can be prevented from meeting andblending with certainty.

As such, according to the TFT substrate 101 pertaining to the presentembodiment, the organic semiconductor layer 1017 a corresponding to theaperture 1016 b and the organic semiconductor layer 1017 b correspondingto the aperture 1016 c can be formed with high accuracy and as plannedbeforehand. In addition, in the TFT substrate 101 pertaining to thepresent embodiment, the layer thickness of each of the organicsemiconductor layers 1017 a and 1017 b can be controlled with highprecision.

As such, the TFT substrate 101 pertaining to the present embodiment, theorganic EL display panel 10 including the TFT substrate 101, and theorganic EL display device 1 having a structure including the organic ELdisplay panel 10 have high quality since, upon formation of the organicsemiconductor layers 1017 a, 1017 b in the TFT substrate 101, theorganic semiconductor ink 10170, 10171 is prevented from meeting andblending with each other.

Note that the above-described effect is a result of (i) the positionalarrangement of the source electrodes 1014 a, 1014 b and the drainelectrodes 1014 c, 1014 d at the bottom portion of the apertures 1016 b,1016 c, and (ii) a specific relationship between the liquid repellencyof the surfaces of the partition walls 1016, the liquid repellency ofthe surface of the insulating layer 1013, and the liquid repellency ofthe surfaces of the source electrodes 1014 a, 1014 b and the drainelectrodes 1014 c, 1014 d. In specific, the following relationship issatisfied when denoting: the liquid repellency of the surfaces of thepartition walls 1016 as R_(W); the liquid repellency of the surface ofthe insulating layer 1013 as R₁; and the liquid repellency of thesurfaces of the source electrodes 1014 a, 1014 b and the drainelectrodes 1014 c, 1014 d as R_(E).R _(W) >R ₁ >R _(E)  [Math. 2]

Note that, the liquid repellency denoted by each of R_(W), R₁, and R_(E)indicates the liquid repellency of the corresponding surface(s) withrespect to the organic semiconductor ink 10170, 10171.

In the meantime, when seen from an opposite point of view, or that is,in terms of wettability, the characteristics of the surfaces of thepartition walls 1016, the characteristics of the surface of theinsulating layer 1013, and the characteristics of the surfaces of thesource electrodes 1014 a, 1014 b and the drain electrodes 1014 c, 1014 dsatisfy the following relationship.W _(W) <W ₁ <W _(E)  [Math. 3]

In Math. 3, W_(W) denotes the wettability of the surfaces of thepartition walls 1016, W₁ denotes the wettability of the surface of theinsulating layer 1013, and W_(E) denotes the wettability of the surfacesof the source electrodes 1014 a, 1014 b and the drain electrodes 1014 c,1014 d.

As described up to this point, according to the present embodiment,control is performed of (i) the positional arrangement of the sourceelectrodes 1014 a, 1014 b and the drain electrodes 1014 c, 1014 d at thebottom portions of the apertures 1016 b, 1016, and (ii) the relationshipbetween the liquid repellency of the surfaces of the partition walls1016, the liquid repellency of the surface of the insulating layer 1013,and the liquid repellency of the surfaces of the source electrodes 1014a, 1014 b and the drain electrodes 1014 c, 1014 d. Due to this, thesurfaces of the organic semiconductor ink 10170, 10171, upon applicationin the manufacturing of the TFT substrate 101, exhibit the shapes asillustrated in FIG. 7. Hence, the organic semiconductor ink 10170dropped with respect to the aperture 1016 b and the organicsemiconductor ink 10171 dropped with respect to the aperture 1016 c areeffectively prevented from meeting and blending with each other. Thisresults in the organic semiconductor layer 1017 a and the organicsemiconductor layer 1017 b being separately formed as plannedbeforehand, which further results in prevention of mixing of componentsbetween the organic semiconductor layer 1017 a and the organicsemiconductor layer 1017 b and changes in layer thicknesses of theorganic semiconductor layer 1017 a and the organic semiconductor layer1017 b. As such, the TFT substrate 101, the organic EL display panel 10,and the organic EL display device 1 are ensured to have high quality,and at the same time, to have high yield in the manufacture thereof.

Note that, by disposing the source electrode 1014 a and the drainelectrode 1014 c at the bottom portion of the aperture 1016 b and thesource electrode 1014 b and the drain electrode 1014 d at the bottomportion of the aperture 1016 c according to the positional arrangementillustrated in FIG. 3A, the exposed portion 1013 a of the insulatinglayer 1013 is formed at the bottom portion of the aperture 1016 b andthe exposed portion 1013 b of the insulating layer 1013 is formed at thebottom portion of the aperture 1016 c as illustrated in FIG. 3B.Accordingly, at the bottom portion of the aperture 1016 b, the area ofthe portion of the insulating layer 1013 remaining exposed (i.e., thearea of the exposed portion 1013 a) is greater in the right side of thebottom portion in the X axis direction compared to in the left side.Similarly, at the bottom portion of the aperture 1016 c, the area of theportion of the insulating layer 1013 remaining exposed (i.e., the areaof the exposed portion 1013 b) is greater in the left side of the bottomportion in the X axis direction compared to in the right side. Such arelationship is also effective in achieving the above-described effects.

Embodiment 2

In the following, description is provided on a structure of a TFTsubstrate pertaining to embodiment 2 of the present disclosure, withreference to FIG. 9A. FIG. 9A corresponds to FIG. 3A in embodiment 1,and other than differences between the structures illustrated in FIG. 9Aand FIG. 3A, embodiment 2 is similar to embodiment 1. As such, thestructures similar between embodiment 2 and embodiment 1 are notillustrated in the drawings nor will be described in the following.

As illustrated in FIG. 9A, the TFT substrate pertaining to the presentembodiment has partition walls 2016 that define two apertures, namelyapertures 2016 b, 2016 c. At the bottom portion of the aperture 2016 b,a source electrode 2014 a and a drain electrode 2014 c are disposed.Similarly, at the bottom portion of the aperture 2016 c, a sourceelectrode 2014 b, and a drain electrode 2014 d are disposed.

The source electrode 2014 a and the drain electrode 2014 c at the bottomportion of the aperture 2016 b each have a T-shape in plan view.Similarly, the source electrode 2014 b and the drain electrode 2014 d atthe bottom portion of the aperture 2016 c each have a T-shape in planview. A portion of the source electrode 2014 a extending in the X axisdirection faces a portion of the drain electrode 2014 c extending in theX axis direction, and similarly, a portion of the source electrode 2014b extending in the X axis direction faces a portion of the drainelectrode 2014 d extending in the X axis direction. Further, at thebottom portion of the aperture 2016 b, a line L₇ passing through acenter of a total of areas of the source electrode 2014 a and the drainelectrode 2014 c is offset in the left direction along the X axis from aline L₅ passing through a center of area of the bottom portion of theaperture 2016 b in the X axis direction by a distance x₃. Similarly, atthe bottom portion of the aperture 2016 c, a line L₃ passing through acenter of a total of areas of the source electrode 2014 b and the drainelectrode 2014 d is offset in the right direction along the X axis froma line L₆ passing through a center of area of the bottom portion of theaperture 2016 c in the X axis direction by a distance x₄.

In the TFT substrate pertaining to the present embodiment, at the bottomportion of the aperture 2016 b, each of the source electrode 2014 a andthe drain electrode 2014 c is located apart, in the X axis direction,from a side surface portion, of the partition walls 2016, facing theaperture 2016 b, and similarly, at the bottom portion of the aperture2016 c, each of the source electrode 2014 b and the drain electrode 2016d is located apart, in the X axis direction, from a side surfaceportion, of the partition walls 2016, facing the aperture 2016 c.

In addition, at the bottom portion of the aperture 2016 b before theformation of an organic semiconductor layer, an exposed portion 2013 aof an insulating layer 2013 occupies a greater area in the right side ofthe bottom portion in the X axis direction compared to in the left side,as illustrated in FIG. 9A. Similarly, at the bottom portion of theaperture 2016 c before the formation of an organic semiconductor layer,an exposed portion 2013 b of the insulating layer 2013 occupies agreater area in the left side of the bottom portion in the X axisdirection compared to in the right side, as illustrated in FIG. 9A.

The TFT substrate pertaining to the present embodiment, due to beingprovided with the structure described above, achieves the same effectsas the structure described in embodiment 1. In addition, similar asdescribed in embodiment 1 above, an organic EL display panel and anorganic EL display device including the TFT substrate pertaining to thepresent embodiment are ensured to have high quality, and at the sametime, to have high yield in the manufacture thereof.

Embodiment 3

In the following, description is provided on a structure of a TFTsubstrate pertaining to embodiment 3 of the present disclosure, withreference to FIG. 9B. FIG. 9B corresponds to FIG. 3A in embodiment 1,and other than differences between the structures illustrated in FIG. 9Band FIG. 3A, embodiment 3 is similar to embodiments 1 and 2. As such,the structures similar between embodiment 3 and embodiments 1 and 2 arenot illustrated in the drawings nor will be described in the following.

As illustrated in FIG. 9B, partition walls 3016 in the TFT substratepertaining to the present embodiment define two apertures, namelyapertures 3016 b, 3016 c. At a bottom portion of the aperture 3016 b, asource electrode 3014 a and a drain electrode 3014 c are disposed. At abottom portion of the aperture 3016 c, a source electrode 3014 b and adrain electrode 3014 d are disposed.

The source electrode 3014 a and the drain electrode 3014 c at the bottomportion of the aperture 3016 b each have a comb shape in plan view andeach have a comb-teeth portion. Similarly, the source electrode 3014 band the drain electrode 3014 d at the bottom portion of the aperture3016 c each have a comb shape in plan view and each have a comb-teethportion. At the bottom portion of the aperture 3016 b, the comb teethportion of the source electrode 3014 a faces the comb teeth portion ofthe drain electrode 3014 c. Similarly, at the bottom portion of theaperture 3016 c, the comb teeth portion of the source electrode 3014 bfaces the comb teeth portion of the drain electrode 3014 d. Further, atthe bottom portion of the aperture 3016 b, a line L₁₁ passing through acenter of a total of areas of the source electrode 3014 a and the drainelectrode 3014 c is offset in the left direction along the X axis from aline L₉ passing through a center of area of the bottom portion of theaperture 3016 b in the X axis direction by a distance x₅. Similarly, atthe bottom portion of the aperture 3016 c, a line L_(I), passing througha center of a total of areas of the source electrode 3014 b and thedrain electrode 3014 d is offset in the right direction along the X axisfrom a line L₁₀ passing through a center of area of the bottom portionof the aperture 3016 c in the X axis direction by a distance x₆.

Here, it should be noted that in the present embodiment, at the bottomportion of the aperture 3016 b, not both of the source electrode 3014 aand the drain electrode 3014 c are disposed so as to be offset in the Xaxis direction. Rather, only the drain electrode 3014 c is disposed soas to be offset in the left direction along the X axis while the sourceelectrode 3014 a is disposed such that a center of area thereofsubstantially coincides with a center of area of the bottom portion ofthe aperture 3016 b. Similarly, at the bottom portion of the aperture3016 c, the drain electrode 3014 d is disposed so as to be offset in theright direction along the X axis, but the source electrode 3014 b isdisposed such that a center of area thereof substantially coincides witha center of area of the bottom portion of the aperture 3016 c.

In addition, similar as in the above, in the TFT substrate pertaining tothe present embodiment, at the bottom portion of the aperture 3016 b,each of the source electrode 3014 a and the drain electrode 3014 c islocated apart from both sides in the X axis direction (i.e., the rightand left sides) of a side surface portion, of the partition walls 3016,facing the aperture 3016 b, and similarly, at the bottom portion of theaperture 3016 c, each of the source electrode 3014 b and the drainelectrode 3014 d is located apart from both sides in the X axisdirection (i.e., the right and left sides) of a side surface portion, ofthe partition walls 3016, facing the aperture 3016 c.

In addition, at the bottom portion of the aperture 3016 b before theformation of an organic semiconductor layer, an area of an insulatinglayer 3013 remaining exposed (i.e., an area of an exposed portion 3013a) is greater in the right side of the bottom portion in the X axisdirection compared to in the left side, as illustrated in FIG. 9B.Similarly, at the bottom portion of the aperture 3016 c before theformation of an organic semiconductor layer, an area of the insulatinglayer 3013 remaining exposed (i.e., an area of an exposed portion 3013b) is greater in the left side of the bottom portion in the X axisdirection compared to in the right side, as illustrated in FIG. 9B.

The TFT substrate pertaining to the present embodiment, due to beingprovided with the structure described above, achieves the same effectsas the structure described in embodiment 1. In addition, similar asdescribed in embodiment 1 above, an organic EL display panel and anorganic EL display device including the TFT substrate pertaining to thepresent embodiment are ensured to have high quality, and at the sametime, to have high yield in the manufacture thereof.

In addition, according to the present embodiment, the source electrodes3014 a, 3014 b and the drain electrodes 3014 c, 3014 d each have a combshape, and further, the comb-teeth portion of the source electrode 3014a faces the comb-teeth portion of the drain electrode 3014 c, and thecomb-teeth portion of the source electrodes 3014 b faces the comb-teethportion of the drain electrode 3014 d. As such, the areas of theelectrodes facing the corresponding electrode increase, which leads toan improvement in transistor characteristics.

Embodiment 4

In the following, description is provided on a structure of a TFTsubstrate pertaining to embodiment 4 of the present disclosure, withreference to FIG. 9C. FIG. 9C corresponds to FIG. 3A in embodiment 1,and other than differences between the structures illustrated in FIG. 9Cand FIG. 3A, embodiment 4 is similar to embodiments 1, 2, and 3. Assuch, the structures similar between embodiment 4 and embodiments 1, 2,and 3 are not illustrated in the drawings nor will be described in thefollowing.

As illustrated in FIG. 9C, partition walls 4016 in the TFT substratepertaining to the present embodiment define two apertures, namelyapertures 4016 b, 4016 c. Further, each of the apertures 4016 b, 4016 chas an opening having a substantially circular shape, and each of theapertures 4016 b, 4016 c has a bottom portion having a substantiallycircular shape. At the bottom portion of the aperture 4016 b, a sourceelectrode 4014 a and a drain electrode 4014 c each having an outline ofa circular shape or a shape of a circular arc are disposed. Similarly,at the bottom portion of the aperture 4016 c, a source electrode 4014 band a drain electrode 4014 d each having an outline of a circular shapeor a shape of a circular arc are disposed.

Further, at the bottom portion of the aperture 4016 b, each of thesource electrode 4014 a and the drain electrode 4014 c is disposed so asto be offset such that a center of area thereof is offset in the leftdirection along the X axis from a line L₁₃ passing through a center ofarea of the bottom portion of the aperture 4016 b. On the other hand, atthe bottom portion of the aperture 4016 c, each of the source electrode4014 b and the drain electrode 4014 d is disposed so as to be offsetsuch that a center of area thereof is offset in the right directionalong the X axis from a line L₁₄ passing through a center of area of thebottom portion of the aperture 4016 c. Due to this, at the bottomportion of the aperture 4016 b, a line L₁₅ passing through a center of atotal of areas of the source electrode 4014 a and the drain electrode4014 c is offset in the left direction along the X axis from a line L₁₃passing through a center of area of the bottom portion of the aperture4016 b in the X axis direction by a distance x₇. Similarly, at thebottom portion of the aperture 4016 c, a line L₁₆ passing through acenter of a total of areas of the source electrode 4014 b and the drainelectrode 4014 d is offset in the right direction along the X axis froma line L₁₄ passing through a center of area of the bottom portion of theaperture 4016 c in the X axis direction by a distance x₈.

Similar as in the above, in the TFT substrate pertaining to the presentembodiment, at the bottom portion of the aperture 4014 b, each of thesource electrode 4014 a and the drain electrode 4014 c is located apartfrom both sides in the X axis direction (i.e., the right and left sides)of a side surface portion, of the partition walls 4016, facing theaperture 4016 b, and similarly, at the bottom portion of the aperture4016 c, each of the source electrode 4014 b and the drain electrode 4016d is located apart from both sides in the X axis direction (i.e., theright and left sides) of a side surface portion, of the partition walls4016, facing the aperture 4016 c.

In addition, at the bottom portion of the aperture 4016 b before theformation of an organic semiconductor layer, an exposed portion of aninsulating layer 4013 (i.e., an exposed portion 4013 a) occupies agreater area in the right side of the bottom portion in the X axisdirection compared to in the left side, as illustrated in FIG. 9C.Similarly, at the bottom portion of the aperture 4016 c before theformation of an organic semiconductor layer, an exposed portion of theinsulating layer 4013 (i.e., an exposed portion 4013 b) occupies agreater area in the left side of the bottom portion in the X axisdirection compared to in the right side, as illustrated in FIG. 9C.

The TFT substrate pertaining to the present embodiment, due to beingprovided with the structure described above, achieves the same effectsas the structure described in embodiment 1. In addition, similar asdescribed in embodiment 1 above, an organic EL display panel and anorganic EL display device including the TFT substrate pertaining to thepresent embodiment are ensured to have high quality, and at the sametime, to have high yield in the manufacture thereof.

In addition, in the present embodiment, the source electrodes 4014 a,4014 b and the drain electrodes 4014 c, 4014 d have the respectiveshapes as illustrated in FIG. 9C. As such, the areas of the electrodesfacing the corresponding electrode increase, and further, a so-called“sneak current” is reduced.

Embodiment 5

In the following, description is provided on a structure of a TFTsubstrate pertaining to embodiment 5 of the present disclosure, withreference to FIG. 10A. FIG. 10A corresponds to FIG. 3A in embodiment 1,and other than differences between the structures illustrated in FIG.10A and FIG. 3A, embodiment 5 is similar to embodiments 1, 2, 3, 4, etc.As such, the structures similar between embodiment 5 and embodiments 1,2, 3, 4, etc., are not illustrated in the drawings nor will be describedin the following.

As illustrated in FIG. 10A, partition walls 5016 in the TFT substratepertaining to the present embodiment define two apertures, namelyapertures 5016 b, 5016 c. Further, each of the apertures 5016 b, 5016 chas an opening having a quadrilateral shape and a bottom portion havinga quadrilateral shape, similar as in embodiments 1, 2, and 3 above. Atthe bottom portion of the aperture 5016 b, a source electrode 5014 a anda drain electrode 5014 c each having an outline of a substantiallysquare shape or a rectangular shape are disposed. Similarly, at bottomportion of the aperture 5016 c, a source electrode 5014 b and a drainelectrode 5014 d each having an outline of a substantially square shapeor a rectangular shape are disposed.

Further, lengths in the X axis direction of the source electrode 5014 aand the drain electrode 5014 c disposed at the bottom portion of theaperture 5016 b differ from each other, and similarly, lengths in the Xaxis direction of the source electrode 5014 b and the drain electrode5014 d disposed at the bottom portion of the aperture 5016 c differ fromeach other. In addition, at the bottom portion of each of the apertures5016 b, 5016 c, the corresponding one of the source electrodes 5014 a,5015 b is disposed such that a center of area thereof in the X axisdirection substantially coincides with a line L₁₇ passing through acenter of area of the bottom portion.

On the other hand, the drain electrode 5014 c has a longer length in theX axis direction compared to the corresponding source electrode 5014 a,and is disposed at the bottom portion of the aperture 5016 b such that acenter of area thereof is offset in the left direction along the X axisfrom the line L₁₇ passing through the center of area of the bottomportion. Similarly, the drain electrode 5014 d has a longer length inthe X axis direction compared to the corresponding source electrode 5014b, and is disposed at the bottom portion of the aperture 5016 c suchthat a center of area thereof is offset in the right direction along theX axis from the line L₁₈ passing through the center of area of thebottom portion.

At the bottom portion of the aperture 5016 b pertaining to the presentembodiment, a line L₁₉ passing through a center of a total of areas ofthe source electrode 5014 a and the drain electrode 5014 c is offset inthe left direction along the X axis from the line L₁₇ passing throughthe center of area of the bottom portion of the aperture 5016 b in the Xaxis direction by a distance x₉. Similarly, at the bottom portion of theaperture 5016 c, a line L₂₀ passing through a center of a total of areasof the source electrode 5014 b and the drain electrode 5014 d is offsetin the right direction along the X axis from the line L₁₃ passingthrough the center of area of the bottom portion of the aperture 5016 cin the X axis direction by a distance x₁₀.

In addition, in the TFT substrate pertaining to the present embodiment,at the bottom portion of the aperture 5016 b, the source electrode 5014a is located apart from a side surface portion, of the partition walls5016, facing the aperture 5016 b at both sides thereof (the left andright sides) in the X axis direction. Further, at the bottom portion ofthe aperture 5016 b, the drain electrode 5014 c is located apart fromthe side surface portion facing the aperture 5016 b at a right sidethereof in the X axis direction while being in contact with the sidesurface portion facing the aperture 5016 b at a left side thereof in theX axis direction. On the other hand, at the bottom portion of theaperture 5016 c, the source electrode 5014 b is located apart from aside surface portion, of the partition walls 5016, facing the aperture5016 c at both sides thereof (the left and right sides) in the X axisdirection. Further, at the bottom portion of the aperture 5016 c, thedrain electrode 5014 d is located apart from the side surface portionfacing the aperture 5016 c at a left side thereof in the X axisdirection while being in contact with the side surface portion facingthe aperture 5016 c at a right side thereof in the X axis direction.

In addition, at the bottom portion of the aperture 5016 b before theformation of an organic semiconductor layer, an area of an insulatinglayer 5013 remaining exposed (i.e., an area of an exposed portion 5013a) is greater in the right side of the bottom portion in the X axisdirection compared to in the left side, as illustrated in FIG. 10A.Similarly, at the bottom portion of the aperture 5016 c before theformation of an organic semiconductor layer, an area of the insulatinglayer 5013 remaining exposed (i.e., an area of an exposed portion 5013b) is greater in the left side of the bottom portion in the X axisdirection compared to in the right side, as illustrated in FIG. 10A.

The TFT substrate pertaining to the present embodiment, due to beingprovided with the structure described above, achieves the same effectsas the structure described in embodiment 1. In addition, similar asdescribed in embodiment 1 above, an organic EL display panel and anorganic EL display device including the TFT substrate pertaining to thepresent embodiment are ensured to have high quality, and at the sametime, to have high yield in the manufacture thereof.

Embodiment 6

In the following, description is provided on a structure of a TFTsubstrate pertaining to embodiment 6 of the present disclosure, withreference to FIG. 10B. FIG. 10B corresponds to FIG. 3A in embodiment 1,and other than differences between the structures illustrated in FIG.10B and FIG. 3A, embodiment 6 is similar to embodiments 1, 2, 3, 4, 5,etc. As such, the structures similar between embodiment 6 andembodiments 1, 2, 3, 4, 5, etc., are not illustrated in the drawings norwill be described in the following.

As illustrated in FIG. 10B, partition walls 6016 in the TFT substratepertaining to the present embodiment define two apertures, namelyapertures 6016 b, 6016 c. Further, each of the apertures 6016 b, 6016 chas an opening having a quadrilateral shape and a bottom portion havinga quadrilateral shape, similar as in embodiments 1, 2, 3, and 5 above.Further, a drain electrode 6014 c disposed at the bottom portion of theaperture 6016 b has a rectangular shape, and similarly, a drainelectrode 6014 d disposed at the bottom portion of the aperture 6016 chas a rectangular shape.

On the other hand, a source electrode 6014 a disposed at the bottomportion of the aperture 6016 b has a U-shape in plan view, and faces apart of the drain electrode 6014 c at three sides thereof. Similarly, asource electrode 6014 b disposed at the bottom portion of the aperture6016 c has a U-shape in plan view, and faces a part of the drainelectrode 6014 d at three sides thereof.

Further, at the bottom portion of the aperture 6016 b, the sourceelectrode 6014 a is disposed such that a center of area of the sourceelectrode 6014 a is offset in the left direction along the X axis from aline L₂₁ passing through a center of area of the bottom portion of theaperture 6016 b. Similarly, at the bottom portion of the aperture 6016c, the source electrode 6014 b is disposed such that a center of area ofthe source electrode 6014 b is offset in the right direction along the Xaxis from a line L₂₂ passing through a center of area of the bottomportion of the aperture 6016 c.

On the other hand, at the bottom portion of the aperture 6016 b, thedrain electrode 6014 c is disposed such that a center of area thereof isoffset in the right direction along the X axis from the line L₂₁ passingthrough the center of area of the bottom portion of the aperture 6016 b.Similarly, at the bottom portion of the aperture 6016 c, the drainelectrode 6014 d is disposed such that a center of area thereof isoffset in the left direction along the X axis from the line passingthrough the center of area of the bottom portion of the aperture 6016 c.

At the bottom portion of the aperture 6016 b pertaining to the presentembodiment, a line L₂₃ passing through a center of a total of areas ofthe source electrode 6014 a and the drain electrode 6014 c is offset inthe left direction along the X axis from the line L₂₁ passing throughthe center of area of the bottom portion of the aperture 6016 b in the Xaxis direction by a distance x₁₁. Similarly, at the bottom portion ofthe aperture 6016 c, a line L₂₄ passing through a center of a total ofareas of the source electrode 6014 b and the drain electrode 6014 d isoffset in the right direction along the X axis from the line passingthrough the center of area of the bottom portion of the aperture 6016 cin the X axis direction by a distance x₁₂.

In addition, in the TFT substrate pertaining to the present embodiment,each of upper and lower portions of the source electrode 6014 a in the Yaxis direction and a left portion of the source electrode 6014 a in theX axis direction are in contact with a side surface portion, of thepartition walls 6016, facing the aperture 6016 b while a right portionof the source electrode 6014 a in the X axis direction is located apartfrom the side surface portion facing the aperture 6016 b. On the otherhand, a right portion of the drain electrode 6014 c in the X axisdirection is in contact with the side surface portion facing theaperture 6016 b while a left portion of the drain electrode 6014 c inthe X axis direction is located apart from the side surface portionfacing the aperture 6016 b. Similarly, at the bottom portion of theaperture 6016 c, each of upper and lower portions of the sourceelectrode 6014 b in the Y axis direction and a right portion of thesource electrode 6014 b in the X axis direction are in contact with aside surface portion, of the partition walls 6016, facing the aperture6016 c while a left portion of the source electrode 6014 b in the X axisdirection is located apart from the side surface portion facing theaperture 6016 c. On the other hand, a left portion of the drainelectrode 6014 d in the X axis direction is in contact with the sidesurface portion facing the aperture 6016 c while a right portion of thedrain electrode 6014 d in the X axis direction is located apart from theside surface portion facing the aperture 6016 c.

In addition, at the bottom portion of the aperture 6016 b before theformation of an organic semiconductor layer, an area of an insulatinglayer 6013 remaining exposed (i.e., an area of an exposed portion 6013a) is greater in the right side of the bottom portion in the X axisdirection compared to in the left side, as illustrated in FIG. 10B.Similarly, at the bottom portion of the aperture 6016 c before theformation of an organic semiconductor layer, an area of the insulatinglayer 6013 remaining exposed (i.e., an area of an exposed portion 6013b) is greater in the left side of the bottom portion in the X axisdirection compared to in the right side, as illustrated in FIG. 10B.

The TFT substrate pertaining to the present embodiment, due to beingprovided with the structure described above, achieves the same effectsas the structure described in embodiment 1. In addition, similar asdescribed in embodiment 1 above, an organic EL display panel and anorganic EL display device including the TFT substrate pertaining to thepresent embodiment are ensured to have high quality, and at the sametime, to have high yield in the manufacture thereof.

Embodiment 7

In the following, description is provided on a structure of a TFTsubstrate pertaining to embodiment 7 of the present disclosure, withreference to FIG. 10C. FIG. 10C corresponds to FIG. 3A in embodiment 1,and other than differences between the structures illustrated in FIG.10C and FIG. 3A, embodiment 7 is similar to embodiments 1, 2, 3, 4, 5,6, etc. As such, the structures similar between embodiment 7 andembodiments 1, 2, 3, 4, 5, 6, etc., are not illustrated in the drawingsnor will be described in the following.

As illustrated in FIG. 10C, partition walls 7016 in the TFT substratepertaining to the present embodiment define two apertures, namelyapertures 7016 b, 7016 c. Further, each of the apertures 7016 b, 7016 chas an opening having a quadrilateral shape and a bottom portion havinga quadrilateral shape, similar as in embodiments 1, 2, 3, 5, and 6above. At the bottom portion of the aperture 7016 b, a source electrode7014 a and a drain electrode 7014 c each having an outline of asubstantially square shape or a rectangular shape are disposed.Similarly, at bottom portion of the aperture 7016 c, a source electrode7014 b and a drain electrode 7014 d each having an outline of asubstantially square shape or a rectangular shape are disposed.

Further, at the bottom portion of the aperture 7016 b, the sourceelectrode 7014 a is disposed such that a center of area of the sourceelectrode 7014 a is offset in the left direction along the X axis from aline L₂₅ passing through a center of area of the bottom portion of theaperture 7016 b. Similarly, at the bottom portion of the aperture 7016c, the source electrode 7014 b is disposed such that a center of area ofthe source electrode 7014 b is offset in the right direction along the Xaxis from a line L₂₆ passing through a center of area of the bottomportion of the aperture 7016 c.

On the other hand, at the bottom portion of the aperture 7016 b, thedrain electrode 7014 c, which has relatively small area compared to thesource electrode 7014 a, is disposed such that a center thereof isoffset in the right direction along the X axis from the line L₂₅ passingthrough the center of area of the bottom portion of the aperture 7016 b.Similarly, at the bottom portion of the aperture 7016 c, the drainelectrode 7014 d, which has relatively small area compared to the sourceelectrode 7014 b, is disposed such that a center of area thereof isoffset in the left direction along the X axis from the line L₂₆ passingthrough the center of area of the bottom portion of the aperture 6016 c.

At the bottom portion of the aperture 7016 b pertaining to the presentembodiment, a line L₂₇ passing through a center of a total of areas ofthe source electrode 7014 a and the drain electrode 7014 c is offset inthe left direction along the X axis from the line L₂₅ passing throughthe center of area of the bottom portion of the aperture 7016 b in the Xaxis direction by a distance x₁₃. Similarly, at the bottom portion ofthe aperture 7016 c, a line L₂₈ passing through a center of a total ofareas of the source electrode 7014 b and the drain electrode 7014 d isoffset in the right direction along the X axis from the line L₂₆ passingthrough the center of area of the bottom portion of the aperture 7016 cin the X axis direction by a distance x₁₄.

In addition, in the TFT substrate pertaining to the present embodiment,each of upper and lower portions of the source electrode 7014 a in the Yaxis direction and a left portion of the source electrode 7014 a in theX axis direction are in contact with a side surface portion, of thepartition walls 7016, facing the aperture 7016 b while a right portionof the source electrode 7014 a in the X axis direction is located apartfrom the side surface portion facing the aperture 7016 b. On the otherhand, upper and lower portions of the drain electrode 7014 c in the Yaxis direction are in contact with the side surface portion facing theaperture 7016 b while both portions of the drain electrode 7014 c in theX axis direction are located apart from the side surface portion facingthe aperture 7016 b. Similarly, at the bottom portion of the aperture7016 c, each of upper and lower portions of the source electrode 7014 bin the Y axis direction and a right portion of the source electrode 7014b in the X axis direction are in contact with a side surface portion, ofthe partition walls 7016, facing the aperture 7016 c while a leftportion of the source electrode 7014 b in the X axis direction islocated apart from the side surface portion facing the aperture 7016 c.On the other hand, upper and lower portions of the drain electrode 7014d in the Y axis direction are in contact with the side surface portionfacing the aperture 7016 c while both portions of the drain electrode7014 d in the X axis direction are located apart from the side surfaceportion facing the aperture 7016 c.

In addition, at the bottom portion of the aperture 7016 b before theformation of an organic semiconductor layer, an area of an insulatinglayer 7013 remaining exposed (i.e., an area of an exposed portion 7013a) is greater in the right side of the bottom portion in the X axisdirection compared to in the left side, as illustrated in FIG. 10C.Similarly, at the bottom portion of the aperture 7016 c before theformation of an organic semiconductor layer, an area of the insulatinglayer 7013 remaining exposed (i.e., an area of an exposed portion 7013b) is greater in the left side of the bottom portion in the X axisdirection compared to in the right side, as illustrated in FIG. 10C.

The TFT substrate pertaining to the present embodiment, due to beingprovided with the structure described above, achieves the same effectsas the structure described in embodiment 1. In addition, similar asdescribed in embodiment 1 above, an organic EL display panel and anorganic EL display device including the TFT substrate pertaining to thepresent embodiment are ensured to have high quality, and at the sametime, to have high yield in the manufacture thereof.

[Other Matters]

In the above-described embodiments 1 through 7, description has been ofexamples where, within one side of an aperture that is in a direction ofan adjacent aperture, a portion exists where a source electrode nor adrain electrode exists and thus, where an insulating layer is in directcontact with an organic semiconductor layer. However, the one side mayinclude a portion of the source electrode and/or a portion of the drainelectrode, provided that at a bottom portion of the aperture, a centerof a total of areas of the source electrode and the drain electrode isoffset from a center of area of the bottom portion in a directionopposite the direction of the adjacent aperture.

In the above-described embodiments 1 through 7, description has beenprovided by taking as an example a TFT substrate to be used in theorganic EL display panel 10. However, the TFT substrate mayalternatively be used in a liquid crystal display panel, a fieldemission display panel, etc. Further, the TFT substrate may also be usedin an electronic paper, etc.

In addition, the materials described in the above-described embodimentsare mere examples of such materials that may be used. As such, othermaterials may be used as necessary.

In addition, as illustrated in FIG. 2, the organic EL display panel 10pertaining to embodiment 1 is a top-emission type organic EL displaypanel. However, the organic EL display panel may alternatively be abottom-emission type organic EL display panel. In such a case, thematerials to be used for forming the organic EL display panel and thelayout design of the organic EL display panel may be changed asnecessary.

In addition, in the above, two shapes have been described as examples ofshapes of openings of the apertures defined by the partition walls.However, the apertures defined by the partition walls may alternativelyhave openings of various shapes. For instance, an aperture may have anopening having a square shape as illustrated in FIG. 11A, or may have anopening having a shape as illustrated in FIG. 11B composed of one sidebeing a circular arc and three remaining sides being straight lines.Further, an aperture may have an opening having a circular shape asillustrated in FIG. 9C. In addition, an aperture may have an openinghaving a circular shape as illustrated in FIG. 11C, and another aperturehaving the shape of a circular arc may be provided so as to partiallysurround the circular aperture. Needless to say, the shape of an openingof an aperture corresponding to a channel portion and the shape of anopening of an aperture corresponding to a non-channel portion areinterchangeable.

In addition, description has been provided above of a structure forpreventing organic semiconductor ink applied with respect to oneaperture among two adjacent apertures and organic semiconductor inkapplied with respect to the other one of the two adjacent apertures frommeeting and blending with each other. However, the above-describedstructure is also applicable to cases where three or more adjacentapertures exist. When applied to such cases, the meeting and blending oforganic semiconductor ink between the three or more adjacent aperturescan be prevented.

In addition, description has been provided in the above on a structureincluding an organic semiconductor layer formed by using organicsemiconductor ink. However, a similar structure may alternatively beused for a structure including an inorganic semiconductor layer formedby using inorganic semiconductor ink. In such a case, the same effectsas described above can be achieved. For instance, an amorphous metaloxide semiconductor may be used as the inorganic semiconductor material.It is expected for such semiconductors to be applied to displays,electronic papers, etc., for the transparency possessed thereby.

In terms of mobility, such semiconductors are materials that maypotentially realize a movability of 3 to 20 cm²/Vs, which is desirablein high performance LCD and organic electro-luminescence (EL) displays.

Some commonly-known, representative examples of an amorphous metal oxidesemiconductor include an amorphous indium zinc oxide semiconductor(a-InZnO) containing indium (In) and zinc (Zn) and an amorphous indiumgallium zinc oxide semiconductor (a-InGaZnO), which includes gallium(Ga) as a metal component in addition to indium (In) and zinc (Zn).

For details concerning such inorganic semiconductors, reference may bemade to disclosure in International Application No. WO 2012/035281.

INDUSTRIAL APPLICABILITY

The invention disclosed in the present disclosure is applicable to adisplay device provided with a panel, such as an organic EL displaypanel, and is useful for realizing a TFT device having high quality byrealizing high-definition.

REFERENCE SIGNS LIST

-   -   1 organic EL display device    -   10 organic EL display panel    -   20 drive control circuit portion    -   21-24 drive circuit    -   25 control circuit    -   101 TFT substrate    -   102 planarizing film    -   102 a contact hole    -   103 anode    -   104 light-transmissive conduction film    -   105 hole injection layer    -   106 bank    -   107 hole transport layer    -   108 organic light-emitting layer    -   109 electron transport layer    -   110 cathode    -   111 sealing layer    -   112 adhesion layer    -   113 CF substrate    -   501 mask    -   1011, 1131 CF substrate    -   1012 a, 1012 b gate electrode    -   1013 insulating layer    -   1014 a, 1014 b, 2014 a, 2014 b, 3014 a, 3014 b, 4014 a, 4014 b,        5014 a, 5014 b,    -   6014 a, 6014 b, 7014 a, 7014 b source electrode    -   1014 c, 1014 d, 2014 c, 2014 d, 3014 c, 3014 d, 4014 c, 4014 d,        5014 c, 5014 d,    -   6014 c, 6014 d, 7014 c, 7014 d drain electrode    -   1015, 2015, 3015, 4015, 5015, 6015, 7015 connection wire    -   1016, 2016, 3016, 4016, 5016, 6016, 7016 partition walls    -   1016 a, 1016 b, 1016 c, 2016 b, 2016 c, 3016 b, 3016 c, 4016 b,        4016 c, 5016 b,    -   5016 c, 6016 b, 6016 c, 7016 b, 7016 c aperture    -   1017 a, 1017 b organic semiconductor layer    -   1018 passivation film    -   1132 color filter    -   1133 black matrix    -   10160 photoresist material film    -   10170, 10171 organic semiconductor ink

The invention claimed is:
 1. A thin film transistor device comprising: afirst thin film transistor element and a second thin film transistorelement that are arranged so as to be adjacent to each other with a gaptherebetween, wherein each of the first thin film transistor element andthe second thin film transistor element comprises: a gate electrode; aninsulating layer disposed on the gate electrode; a source electrode anda drain electrode disposed on the insulating layer with a gaptherebetween; and a semiconductor layer disposed on the source electrodeand the drain electrode so as to cover the source electrode and thedrain electrode and fill the gap between the source electrode and thedrain electrode, and being in contact with the source electrode and thedrain electrode; wherein the thin film transistor device furthercomprises partition walls disposed on the insulating layer andpartitioning the semiconductor layer of the first thin film transistorelement from the semiconductor layer of the second thin film transistorelement, the partition walls having liquid-repellant surfaces anddefining a first aperture and a second aperture, the first aperturesurrounds at least a part of each of the source electrode and the drainelectrode of the first thin film transistor element, the second apertureis adjacent to the first aperture and surrounds at least a part of eachof the source electrode and the drain electrode of the second thin filmtransistor element, a bottom portion of each of the first and secondapertures includes a source electrode portion being a bottom portion ofthe source electrode and a drain electrode portion being a bottomportion of the drain electrode, in plan view of the bottom portion ofthe first aperture, a center of a total of areas of the source electrodeportion and the drain electrode portion is offset from a center of areaof the bottom portion in a direction opposite a direction of the secondaperture, and in plan view of the bottom portion of the second aperture,a center of a total of areas of the source electrode portion and thedrain electrode portion is offset from a center of area of the bottomportion in a direction opposite a direction of the first aperture. 2.The thin film transistor device of claim 1, wherein at the bottomportion of the first aperture, a portion exists where the sourceelectrode portion and the drain electrode portion do not exist and thus,where the insulating layer of the first thin film transistor element isin direct contact with the semiconductor layer of the first thin filmtransistor element, the portion being within an area of the bottomportion located in the direction of the second aperture, and at thebottom portion of the second aperture, a portion exists where the sourceelectrode portion and the drain electrode portion do not exist and thus,where the insulating layer of the second thin film transistor element isin direct contact with the semiconductor layer of the second thin filmtransistor element, the portion being within an area of the bottomportion located in the direction of the first aperture.
 3. The thin filmtransistor device of claim 2, wherein at the bottom portion of the firstaperture, the portion where the source electrode portion and the drainelectrode portion do not exist and thus, where the insulating layer ofthe first thin film transistor element is in direct contact with thesemiconductor layer of the first thin film transistor element, alsoexists within an area of the bottom portion located in the directionopposite the direction of the second aperture, and in plan view, theportion occupies a greater area at the area of the bottom portionlocated in the direction of the second aperture than at the area of thebottom portion located in the direction opposite the direction of thesecond aperture, and at the bottom portion of the second aperture, theportion where the source electrode portion and the drain electrodeportion do not exist and thus, where the insulating layer of the secondthin film transistor element is in direct contact with the semiconductorlayer of the second thin film transistor element, also exists within anarea of the bottom portion located in the direction opposite thedirection of the first aperture, and in plan view, the portion occupiesa greater area at the area of the bottom portion located in thedirection of the first aperture than at the area of the bottom portionlocated in the direction opposite the direction of the first aperture.4. The thin film transistor device of claim 1, wherein in plan view ofthe bottom portion of the first aperture, a center of area of one of thesource electrode portion and the drain electrode portion is offset fromthe center of area of the bottom portion in the direction opposite thedirection of the second aperture, and a center of area of the other oneof the source electrode portion and the drain electrode portioncoincides with the center of area of the bottom portion, and in planview of the bottom portion of the second aperture, a center of area ofone of the source electrode portion and the drain electrode portion isoffset from the center of area of the bottom portion in the directionopposite the direction of the first aperture, and a center of area ofthe other one of the source electrode portion and the drain electrodeportion coincides with the center of area of the bottom portion.
 5. Thethin film transistor device of claim 1, wherein in plan view of thebottom portion of the first aperture, a center of area of each of thesource electrode portion and the drain electrode portion is offset fromthe center of area of the bottom portion in the direction opposite thedirection of the second aperture, and in plan view of the bottom portionof the second aperture, a center of area of each of the source electrodeportion and the drain electrode portion is offset from the center ofarea of the bottom portion in the direction opposite the direction ofthe first aperture.
 6. The thin film transistor device of claim 1,wherein at the bottom portion of the first aperture, at least one of thesource electrode portion and the drain electrode portion is locatedapart from a side surface portion, of the partition walls, facing thefirst aperture at a side thereof located in the direction of the secondaperture, and is in contact with the side surface portion facing thefirst aperture at a side thereof located in the direction opposite thedirection of the second aperture, and at the bottom portion of thesecond aperture, at least one of the source electrode portion and thedrain electrode portion is located apart from a side surface portion, ofthe partition walls, facing the second aperture at a side thereoflocated in the direction of the first aperture, and is in contact withthe side surface portion facing the second aperture at a side thereoflocated in the direction opposite the direction of the first aperture.7. The thin film transistor device of claim 1, wherein a liquidrepellency of the surfaces of the partition walls is greater than aliquid repellency of a surface of the insulating layer, in each of thefirst and second thin film transistor elements, that is in contact withthe semiconductor layer, and the liquid repellency of the surface of theinsulating layer, in each of the first and second thin film transistorelements, that is in contact with the semiconductor layer is greaterthan a liquid repellency of a surface of each of the source electrodeand the drain electrode in each of the first and second thin filmtransistor elements.
 8. The thin film transistor device of claim 1,wherein the partition walls further define a third aperture at an areathat is adjacent to at least one of the first aperture and the secondaperture, an area surrounded by the third aperture, not having asemiconductor layer formed therein, does not function as a channelportion, and a bottom portion of the third aperture includes a wireformed for electrically connecting with one of the source electrode andthe drain electrode of the first thin film transistor element or one ofthe source electrode and the drain electrode of the second thin filmtransistor element.
 9. An organic EL display element comprising: thethin film transistor element of claim 8; a planarizing film formed abovethe thin film transistor element and having a contact hole formedtherein; a lower electrode formed so as to cover the planarizing filmand a side surface of the planarizing film defining the contact hole,and electrically connected with one of the source electrode and thedrain electrode in the first thin film transistor element or one of thesource electrode and the drain electrode in the second thin filmtransistor element; an upper electrode formed above the lower electrode;and an organic light-emitting layer interposed between the lowerelectrode and the upper electrode, wherein the contact hole is incommunication with the third aperture of the thin film transistorelement.
 10. An organic EL display device comprising the organic ELdisplay element of claim
 9. 11. A method of manufacturing a thin filmtransistor device comprising: forming a first gate electrode and asecond gate electrode on a substrate so as to be adjacent to each otherwith a gap therebetween; forming an insulating layer so as to cover thefirst gate electrode and the second gate electrode; forming first andsecond source electrodes and first and second drain electrodes on theinsulating layer, wherein (i) the first source electrode and the firstdrain electrode are formed with respect to the first gate electrode witha gap therebetween, and (ii) the second source electrode and the seconddrain electrode are formed with respect to the second gate electrodewith a gap therebetween; depositing a layer of photosensitive resistmaterial such that, above the insulating layer, the layer ofphotosensitive resist material covers the first and second sourceelectrodes and the first and second drain electrodes; forming partitionwalls on the insulating layer by performing mask exposure and patterningof the layer of photosensitive resist material, the partition wallshaving liquid-repellant surfaces and defining a first aperture and asecond aperture that is adjacent to the first aperture, the firstaperture surrounding at least a part of each of the first sourceelectrode and the first drain electrode, the second aperture surroundingat least a part of each of the second source electrode and the seconddrain electrode; and forming a first semiconductor layer with respect tothe first aperture and a second semiconductor layer with respect to thesecond aperture by applying semiconductor material with respect to thecorresponding aperture and drying the semiconductor material so applied,wherein (i) the first semiconductor layer is formed so as to be incontact with the first source electrode and the first drain electrode,and (ii) the second semiconductor layer is formed so as to be in contactwith the second source electrode and the second drain electrode, whereinthe partition walls are formed such that a bottom portion of each of thefirst and second apertures includes a source electrode portion being abottom portion of the corresponding source electrode and a drainelectrode portion being a bottom portion of the corresponding drainelectrode, in plan view of the bottom portion of the first aperture, acenter of a total of areas of the source electrode portion and the drainelectrode portion is offset from a center of area of the bottom portionin a direction opposite a direction of the second aperture, and in planview of the bottom portion of the second aperture, a center of a totalof areas of the source electrode portion and the drain electrode portionis offset from a center of area of the bottom portion in a directionopposite a direction of the first aperture.
 12. The method of claim 11,wherein the partition walls are formed such that at the bottom portionof the first aperture, a portion exists where the source electrodeportion and the drain electrode portion do not exist and thus, where theinsulating layer is to come in direct contact with the firstsemiconductor layer, the portion being within an area of the bottomportion located in the direction of the second aperture, and at thebottom portion of the second aperture, a portion exists where the sourceelectrode portion and the drain electrode portion do not exist and thus,where the insulating layer is to come in direct contact with the secondsemiconductor layer, the portion being within an area of the bottomportion located in the direction of the first aperture.
 13. The methodof claim 12, wherein the partition walls are formed such that at thebottom portion of the first aperture, the portion where the sourceelectrode portion and the drain electrode portion do not exist and thus,where the insulating layer is to come in direct contact with the firstsemiconductor layer, also exists within an area of the bottom portionlocated in the direction opposite the direction of the second aperture,and in plan view, the portion occupies a greater area at the area of thebottom portion located in the direction of the second aperture than atthe area of the bottom portion located in the direction opposite thedirection of the second aperture, and at the bottom portion of thesecond aperture, the portion where the source electrode portion and thedrain electrode portion do not exist and thus, where the insulatinglayer is to come in direct contact with the second semiconductor layer,also exists within an area of the bottom portion located in thedirection opposite the direction of the first aperture, and in planview, the portion occupies a greater area at the area of the bottomportion located in the direction of the first aperture than at the areaof the bottom portion located in the direction opposite the direction ofthe first aperture.
 14. The method of claim 11, wherein the forming ofthe insulating layer, the forming of the first and second sourceelectrodes and the first and second drain electrodes, the forming of thepartition walls, and the forming of the first and second semiconductorlayers are performed such that a liquid repellency of the surfaces ofthe partition walls is greater than a liquid repellency of a surface ofthe insulating layer that is to come in contact with the first andsecond semiconductor layers, and the liquid repellency of the surface ofthe insulating layer is greater than a liquid repellency of a surface ofeach of the first and second source electrodes and each of the first andsecond drain electrodes.